參數(shù)資料
型號: DS3154N
英文描述: Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
中文描述: 單/雙/三/四DS3/E3/STS-1柳斯
文件頁數(shù): 14/60頁
文件大?。?/td> 788K
代理商: DS3154N
DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
14 of 60
NAME
I/O
FUNCTION
transaction, with R/
W
= 1 indicating a read and R/
W
= 0 indicating a write.
Read Enable (Active Low) or Data Strobe (Active Low). In Intel bus mode (MOT = 0),
RD
is asserted
to read internal registers. In Motorola bus mode (MOT = 1), the rising edge of
DS
writes data to
internal registers.
Address Bus. These inputs specify the address of the internal register to be accessed. A5 is not
present on the DS3152. A5 and A4 are not present on the DS3151.
Data Bus. These bidirectional lines are inputs during writes to internal registers. They are outputs
during reads from internal registers.
Interrupt Output (Active Low, Open Drain). This pin is forced low in response to one or more
unmasked, active interrupt sources within the device.
INT
remains low until the interrupt is serviced or
masked.
Positive Supply. 3.3V 5%. All V
DD
signals should be wired together.
Ground Reference. All V
SS
signals should be wired together.
RD
/
DS
I
A[5:0]
I
D[7:0]
I/O
INT
O
V
DD
V
SS
P
P
Table 4-E. JTAG and Test Pin Descriptions
NAME
I/O
JTAG IEEE 1149.1 Test Serial Clock. JTCLK shifts data into JTDI on the rising edge and out of
JTDO on the falling edge. If boundary scan is not used, JTCLK should be pulled high.
JTAG IEEE 1149.1 Test Serial-Data Input (Internal 10k Pullup). Test instructions and data are
clocked in on this pin on the rising edge of JTCLK. If boundary scan is not used, JTDI should be left
unconnected or pulled high.
JTAG IEEE 1149.1 Test Serial-Data Output. Test instructions and data are clocked out on this pin on
the falling edge of JTCLK.
JTAG IEEE 1149.1 Test Reset (Internal 10k Pullup). This pin is used to asynchronously reset the
test access port (TAP) controller. If boundary scan is not used,
JTRST
can be held low or high.
JTAG IEEE 1149.1 Test Mode Select (Internal 10k Pullup). This pin is sampled on the rising edge
of JTCLK and is used to place the port into the various defined IEEE 1149.1 states. If boundary scan
is not used, JTMS should be left unconnected or pulled high.
TEST
I
PU
Factory Test Pin. Leave unconnected or wire high for normal operation.
Note 1:
Pin type I = input pin. Pin type O = output pin. Pin type P = power-supply pin.
Note 2:
Pin type O3 is an output that can be tri-stated.
Note 3:
Pin type I
PU
is an input with an internal 10k pullup.
Note 4:
For pin names of the form PINn, n = LIU# = 1, 2, 3, or 4. PIN1 is on LIU 1, PIN2 is on LIU 2, etc.
Note 5:
Section
14
shows hardware mode and CPU bus mode pin assignments.
Table 4-F. Transmitter Data Select Options
TDSA
TDSB
E3M
STS
Tx MODE
0
0
X
X
Any
0
1
0
0
DS3
0
1
1
0
E3
0
1
1
1
STS-1
0
1
0
1
DS3
1
0
X
X
Any
1
1
1
0
E3
1
1
0
X
DS3
1
1
1
1
STS-1
Note 1:
This coding of the TDSA, TDSB, E3M, and STS bits allows AIS generation to be enabled by holding TDSA = 0 and changing TDSB
from 0 to 1. The type of DS3 AIS signal is selected by the STS bit with E3M = 0.
Note 2:
If E3M and/or STS are changed when {TDSA,TDSB} 00, TDSA and TDSB must both be cleared to 0. After they are cleared, TDSA
and TDSB can be configured to transmit a pattern in the new operating mode.
Table 4-G. Receiver PRBS Pattern Select Options
E3M
STS
Rx MODE
RECEIVER PRBS PATTERN SELECTED
1
0
E3
2
23
- 1 PRBS pattern per ITU O.151
0
X
DS3
1
1
STS-1
FUNCTION
JTCLK
I
JTDI
I
PU
JTDO
O
JTRST
I
PU
JTMS
I
PU
TRANSMIT DATA SELECTED
Normal data as input at TPOS and TNEG
Unframed all ones
DS3 AIS per ANSI T1.107 (
Figure 7-2
)
Unframed 100100… pattern
2
23
- 1 PRBS pattern per ITU O.151
2
15
- 1 PRBS pattern per ITU O.151
2
15
- 1 PRBS pattern per ITU O.151
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