集成電路 (IC) 74SSTL16857DGGRE4品牌、價格、PDF參數
74SSTL16857DGGRE4 品牌、價格
元器件型號 |
廠商 |
描述 |
數量 |
價格 |
74SSTL16857DGGRE4 |
Texas Instruments |
IC REG BUFFER 14BIT 48-TSSOP |
0 |
|
74GTLP22034DGVRE4 |
Texas Instruments |
IC 8BIT REGISTER TXRX 48-TVSOP |
0 |
|
74GTLP22034DGGRE4 |
Texas Instruments |
IC 8BIT REGISTER TXRX 48-TSSOP |
0 |
|
74GTLP22033DGVRE4 |
Texas Instruments |
IC 8BIT REGIST TXRX 48-TVSOP |
0 |
|
74GTLP2034DGGRE4 |
Texas Instruments |
IC 8BIT REGIST TXRX 48-TSSOP |
0 |
|
74ABT18640DGGRE4 |
Texas Instruments |
IC 18BIT INV BUS TXRX 56-TSSOP |
0 |
|
SN74LS31DRE4 |
Texas Instruments |
IC HEX DELAY ELEMENT 16-SOIC |
0 |
|
SN74LS283DRE4 |
Texas Instruments |
IC BIN FULL 4BIT ADD CAR 16-SOIC |
0 |
|
SN74ACT1284PWE4 |
Texas Instruments |
IC 7BIT BUS INTERFC 3ST 20-TSSOP |
0 |
|
SN74ABT8952DLR |
Texas Instruments |
IC SCAN TESST DEVICE 28-SSOP |
0 |
|
SN74ABT8652DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
SN74ABT8652DLRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
0 |
|
SN74ABT8652DLR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
0 |
|
SN74ABT8646DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
SN74ABT8646DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
SN74ABT8543DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
SN74ABT8543DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
SN74ABT18640DLRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
0 |
|
SN74ABT18504PMRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
0 |
|
SN74ABT18504PMR |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
0 |
|
SN74BCT8374ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
0 |
|
SN74BCT8374ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
0 |
|
SN74BCT8373ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
0 |
|
SN74BCT8245ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
0 |
|
SN74BCT8240ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
0 |
|
SN74BCT8240ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
0 |
|
SN74BCT29854DWRE4 |
Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
0 |
|
SN74BCT29854DWE4 |
Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
0 |
|
SN74AS181ANTE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-PDIP |
0 |
|
SN74AS181ADWRE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
74SSTL16857DGGRE4 PDF參數
類別: |
集成電路 (IC)
|
邏輯類型: |
SSTL_2 寄存緩沖器
|
電源電壓: |
2.3 V ~ 3.6 V
|
位數: |
14
|
工作溫度: |
0°C ~ 70°C
|
安裝類型: |
表面貼裝
|
封裝/外殼: |
48-TFSOP(0.240",6.10mm 寬)
|
供應商設備封裝: |
48-TSSOP
|
包裝: |
帶卷 (TR)
|