參數(shù)資料
型號(hào)： EP1K30
廠商： Electronic Theatre Controls, Inc.
英文描述： Programmable Logic Device Family
中文描述： 可編程邏輯器件系列
文件頁數(shù)： 45/86頁
文件大?。?/td> 992K
代理商： EP1K30
Altera Corporation
45
ACEX 1K Programmable Logic Device Family Data Sheet
D
13
T
Generic Testing
Each ACEX 1K device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100
%
yield. AC test measurements for ACEX 1K
devices are made under conditions equivalent to those shown in
Figure 21
. Multiple test patterns can be used to configure devices during
all stages of the production flow.
Figure 21. ACEX 1K AC Test Conditions
Operating
Conditions
Tables 18
through
21
provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V ACEX 1K devices.
To Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
Device
Output
703
[481 ]
8.06 k
[481 ]
VCCIO
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in brackets are for 2.5-V devices
or outputs. Numbers without brackets are
for 3.3-V devices or outputs.
Table 18. ACEX 1K Device Absolute Maximum Ratings
Note (1)
Symbol
Parameter
Conditions
Min
Max
Unit
V
CCINT
V
CCIO
V
I
I
OUT
T
STG
T
AMB
T
J
Supply voltage
With respect to ground
(2)
–
0.5
–
0.5
–
2.0
–
25
–
65
–
65
3.6
4.6
5.75
25
150
135
135
V
V
V
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
mA
°
C
°
C
°
C
No bias
Under bias
PQFP, TQFP, and BGA packages, under
bias
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
EP1K30FC256-1 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 FPGA - ACEX 1K 216 LABs 171 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K30FC256-1N 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 FPGA - ACEX 1K 216 LABs 171 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K30FC256-2 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 FPGA - ACEX 1K 216 LABs 171 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K30FC256-2N 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 FPGA - ACEX 1K 216 LABs 171 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
EP1K30FC256-3 功能描述:FPGA - 現(xiàn)場(chǎng)可編程門陣列 FPGA - ACEX 1K 216 LABs 171 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 柵極數(shù)量: 邏輯塊數(shù)量:943 內(nèi)嵌式塊RAM - EBR:1956 kbit 輸入/輸出端數(shù)量:128 最大工作頻率:800 MHz 工作電源電壓:1.1 V 最大工作溫度:+ 70 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FBGA-256
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