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參數(shù)資料
| 型號(hào)： | EV4101 |
| 廠商： | LSI Corporation |
| 英文描述： | 32-bit Microprocessor that Executes MIPS I,a Subset of MIPS II,and a Subset of the MIPS16 Instructions.(32位微處理器（執(zhí)行MIPS I,MIPS II的子集,MIPS16的子集指令）) |
| 中文描述： | 32位微處理器中執(zhí)行MIPS的我，一個(gè)子集的MIPS的第二，以及對(duì)MIPS16指令集。（32位微處理器（執(zhí)行MIPS的我，MIPS的二的子集，MIPS16的子集指令）） |
| 文件頁(yè)數(shù)： | 43/68頁(yè) |
| 文件大小： | 545K |
| 代理商： | EV4101 |
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TinyRISC
EV4101 Microprocessor Reference Device Technical Summary
43
CTEST_RFWEP
Register File Write Enable
When LOW, writes to the CPU register file are disabled.
This is used when the debug tool is active. This pin
should be held HIGH during normal operation.
Input
IDDTN
IDD Test
When LOW, all static power consuming devices are
turned off. This pin should be held HIGH during normal
operation.
Input
PMON_OUTP Process Monitor
Output for process monitor cell. This pin should be left
UNCONNECTED during normal operation.
Output
SE
Scan Chain Loading Enable
Assertion of this signal enables scan chain loading and
unloading. This pin should be held LOW during normal
operation.
Input
SI
Scan Chain Input
Inputs the scan chain. This pin should be left
UNCONNECTED during normal operation.
Input
SO
Scan Chain Output
Outputs the scan chain. This pin should be left
UNCONNECTED during normal operation.
Output
TN
3-State Outputs
Assertion of this input causes all of the EV4101 outputs
and bidirectional signals to be 3-stated. This pin should
be held HIGH for normal operation.
Input
TST
Scan Test Enable
When high, the SCAN test is enabled. This pin should be
held low during normal operation.
Input
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