參數(shù)資料
型號(hào): EVAL-ADM1026EB
廠(chǎng)商: Analog Devices, Inc.
英文描述: Complete Thermal and System Management Controller
中文描述: 完整的熱和系統(tǒng)管理控制器
文件頁(yè)數(shù): 32/56頁(yè)
文件大小: 634K
代理商: EVAL-ADM1026EB
ADM1026
Notes
Rev. A | Page 32 of 56
For a NAND tree test to work, all outputs (INT, RSTMAIN,
RSTSTBY, and PWM) must remain high during the test.
When generating test waveforms, allow for a typical
propagation delay of 500 ns through the NAND tree.
If any of the inputs shown in Figure 56 are unused, they
should not be connected direct to ground, but via a resistor
such as 10 k. This allows the automatic test equipment
(ATE) to drive every input high so that the NAND tree test
can be properly carried out.
GPIO16
GPIO15
GPIO14
GPIO13
GPIO12
GPIO11
GPIO10
GPIO9
GPIO8
FAN0
FAN1
FAN2
FAN3
FAN4
FAN5
FAN6
FAN7
SCL
SDA
CI
INT
NTESTOUT
0
Figure 57. NAND Tree Test Taking Inputs High in Turn
In the event of an input being nonfunctional (stuck high or low)
or two inputs shorted together, the output pattern is different.
Some examples are given in Figure 59 through Figure 61.
Figure 59 shows the effect of one input being stuck low. The
output pattern is normal until the stuck input is reached.
Because that input is permanently low, neither it nor any inputs
further up the tree can have any effect on the output.
INT
CI
SDA
SCL
FAN7
FAN6
FAN5
FAN4
FAN3
FAN2
FAN1
FAN0
GPIO8
GPIO9
GPIO10
GPIO11
GPIO12
GPIO13
GPIO14
GPIO15
GPIO16
NTESTOUT
0
Figure 58. NAND Tree Test Taking Inputs Low in Turn
GPIO16
GPIO15
GPIO14
GPIO13
GPIO12
GPIO11
GPIO10
GPIO9
GPIO8
FAN0
FAN1
NTESTOUT
0
Figure 59. NAND Tree Test with GPIO11 Stuck Low
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