參數(shù)資料
型號(hào): IBIS4-6600-M-1
廠商: Cypress Semiconductor Corp.
英文描述: High resolution 6.6 M Pixel Rolling shutter CMOS Image sensor
中文描述: 高像素分辨率6.6米,卷簾門的CMOS圖像傳感器
文件頁(yè)數(shù): 57/63頁(yè)
文件大?。?/td> 1286K
代理商: IBIS4-6600-M-1
IBIS4-6600
Datasheet
Cypress Semiconductor Corporation
Contact: info@Fillfactory.com Document #: 38-05708 Rev.**(Revision 1.3 ) Page 57 of 63
3901 North First Street
San Jose, CA 95134
408-943-2600
7 Boundary scan test structures
Table 20 summarizes the pins that can be used to scan through internal nodes. In case
testing is not needed, these pins can be left floating.
Table 21: Boundary scan pins
Boundary scan pins
BS_RESET
BS_CLOCK
BS_DIN
BS_BUS
64
65
66
67
input
input
input
output
Boundary scan: reset
Boundary scan: clock
Boundary scan: in
Boundary scan: bus
The following signals can be connected to the bus (make sure to have only one 1 in
the scan registers at any time) (see Table 220).
Table 22: Internal signals that can be connected to the boundary scan bus.
Internal signals
16
sub_y<3>
17
sub_y<4>
18
sub_y<5>
19
address<3>
20
address<2>
21
address<1>
22
address<0>
23
data<11>
24
data<10>
25
data<9>
26
data<8>
27
data<7>
28
data<6>
29
data<5>
30
data<4>
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
eos_yl_shift
clk_x_seq
sync_x_seq
clk_y_seq
sync_yl_seq
reset_seq
tri_l_seq
select_seq
sub_x<1>
sub_x<2>
sub_x<3>
sub_x<4>
sub_x<5>
sub_y<1>
sub_y<2>
31
32
33
34
35
36
37
38
39
40
41
42
43
44
data<3>
data<2>
data<1>
data<0>
eos_yr_shift
eos_x_shift
sync_yr_shift
tri_r_seq
cal_seq
slowfast_seq
black_seq
precharge_seq
sample_S_seq
sample_R_seq
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