參數(shù)資料
型號(hào): IKP10N60T
廠商: INFINEON TECHNOLOGIES AG
英文描述: Low Loss DuoPack : IGBT in Trench and Fieldstop technology with soft, fast recovery anti-parallel EmCon HE diode
中文描述: 低損耗DuoPack:在IGBT的溝槽場(chǎng)終止技術(shù)和軟,恢復(fù)快反平行何快恢復(fù)二極管
文件頁(yè)數(shù): 10/14頁(yè)
文件大?。?/td> 396K
代理商: IKP10N60T
TrenchStop Series
IKP10N60T
IKB10N60T
Power Semiconductors
10
Rev. 2 Oct-04
Z
t
,
T
10μs
100μs
1ms
10ms
100ms
10
-2
K/W
10
-1
K/W
10
0
K/W
single pulse
0.01
0.02
0.05
0.1
0.2
D
=0.5
Z
t
,
T
1μs
10μs 100μs
1ms
10ms 100ms
10
-2
K/W
10
-1
K/W
10
0
K/W
single pulse
0.01
0.02
0.05
0.1
0.2
D
=0.5
t
P
,
PULSE WIDTH
t
P
,
PULSE WIDTH
Figure 21. IGBT transient thermal resistance
(
D = t
p
/
T
)
Figure 22. Diode transient thermal
impedance as a function of pulse
width
(
D
=
t
P
/
T
)
t
r
,
R
200A/μs
400A/μs
600A/μs
800A/μs
0ns
50ns
100ns
150ns
200ns
250ns
300ns
T
J
=25°C
T
J
=175°C
Q
r
,
R
200A/μs
400A/μs
600A/μs
800A/μs
0,0μC
0,1μC
0,2μC
0,3μC
0,4μC
0,5μC
0,6μC
0,7μC
0,8μC
T
J
=25°C
T
J
=175°C
di
F
/dt
,
DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery time as
a function of diode current slope
(
V
R
=400V,
I
F
=10A,
Dynamic test circuit in Figure E)
di
F
/dt
,
DIODE CURRENT SLOPE
Figure 24. Typical reverse recovery charge
as a function of diode current
slope
(
V
R
= 400V,
I
F
= 10A,
Dynamic test circuit in Figure E)
R
,(K/W )
0.2911
0.4092
0.5008
0.1529
R
1
τ
,
(s)
6.53*10
-2
8.33*10
-3
7.37*10
-4
7.63*10
-5
C
1
=
τ
1
/
R
1
R
2
C
2
=
τ
2
/
R
2
R
,(K/W )
0.3169
0.4734
0.6662
0.4398
R
1
τ
,
(s)
4.629*10
-2
7.07*10
-3
1.068*10
-3
1.253*10
-4
6
C
1
=
τ
1
/
R
1
R
2
C
2
=
τ
2
/
R
2
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