參數(shù)資料
型號(hào)： JANHCE1N5809
廠(chǎng)商： MICROSEMI CORP-LAWRENCE
元件分類(lèi)： 參考電壓二極管
英文描述： 6 AMPS FAST RECOVERY RECTIFIER CHIP 50 - 150 VOLTS
中文描述： 6 A, SILICON, RECTIFIER DIODE
封裝： DIE-1
文件頁(yè)數(shù)： 14/28頁(yè)
文件大小： 202K
代理商： JANHCE1N5809
MIL-PRF-19500/420H
14
* 4.4.3.1 Group C inspection, table VII of MIL-PRF-19500.
Subgroup
Method
C2
1056
C2
1051
C2
2036
*
C5
3101
or
4081
C6
1027
Condition
0
°
C to +100
°
C, 10 cycles.
-55
°
C to +175
°
C, 25 cycles.
Tension: Test condition A; weight = 5 pounds; t = 30 seconds.
Lead fatigue: Test condition E; weight 2 pounds.
NOTE: Both tension and lead fatigue are not applicable for US devices.
See 4.5.5.
T
J
= 150
°
C minimum (see 4.5.2.1). I
O
= I
O2
= 3 A dc minimum; adjust I
O
to
achieve the required T
J
; apply V
R
= rated
V
RWM
(see col. 3 of 1.3), f = 50-60 Hz
(see 4.5.2.1).
* 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table IX of MIL-PRF-19500 and as specified herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein. See table III for delta limits when applicable.
4.5 Methods of inspection. Methods of inspection shall be as specified in appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Burn-in and life tests. These tests shall be conducted with a half-sine waveform of the specified peak
voltage impressed across the diode in the reverse direction followed by a half-sine waveform of the specified
average rectified current. The forward conduction angle of the rectified current shall be neither greater than 180
degrees, nor less than 150 degrees.
* 4.5.2.1 Free air burn-in. Deliberate heat sinking, baffles to create an oven, forced air-cooling or heating is
prohibited unless otherwise approved by the qualifying activity. The use of a current limiting or ballast resistor is
permitted provided that each DUT still sees the full P
t
(minimum) and that the minimum applied voltage, where
applicable, is maintained through out the burn-in period. T
J
= 135
°
C minimum for screening and T
J
= 150
°
C for 4.4.2
and 4.4.3 life tests. Use method 3100 of MIL-STD-750 to measure T
J
.
4.5.3 Scope display evaluation. Scope display evaluation shall be sharp and stable in accordance with method
4023 of MIL-STD-750. Scope display may be performed on ATE (automatic test equipment) for screening only, with
the approval of the qualifying activity. Scope display in table I, subgroup 4 shall be performed on a scope. The
reverse current (I
BR
) over the knee shall be 500
μ
A peak.
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