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參數(shù)資料
| 型號： | JANKCA1N5550 |
| 廠商： | Electronic Theatre Controls, Inc. |
| 元件分類： | 圓形連接器 |
| 英文描述： | Circular Connector; No. of Contacts:66; Series:MS27508; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:18; Circular Contact Gender:Pin; Circular Shell Style:Box Mount Receptacle; Insert Arrangement:18-35 RoHS Compliant: No |
| 中文描述： | 該規(guī)范涵蓋硅，通用性能要求， |
| 文件頁數(shù)： | 11/28頁 |
| 文件大?。?/td> | 202K |
| 代理商： | JANKCA1N5550 |
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MIL-PRF-19500/420H
11
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E qualification shall be performed herein for qualification or requalification
only. In case qualification was awarded to a prior revision of the specification sheet that did not request the
performance of table II tests, the tests specified in table II herein shall be performed on the first inspection lot to this
revision to maintain qualification.
4.2.2 JANHC and JANKC die. Qualification shall be in accordance with appendix G of MIL-PRF-19500 and as
specified herein.
* 4.3 Screening (JANS, , JANTXV and JANTX levels only). Screening shall be in accordance with table IV of
MIL-PRF-19500 (appendix E), and as specified herein. Specified electrical measurements shall be made in
accordance with table I herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen (see
table IV of
MIL-PRF-19500)
1a
1b
Required
2
Optional
3a
3b
(1) 3c
Thermal impedance (see 4.3.1 and 4.4.1)
4
Not applicable
5
Not applicable
6
Not applicable
7a
7b
Optional
8
Required
9
V
F1
and I
R1
10
Method 1038 of
MIL-STD-750, condition A
11
V
F1
and I
;
V
≤
±
0.1 V dc
I
±
250 nA dc or 100 percent of initial
value whichever is greater.
12
Required, see 4.3.2
(2) 13
Subgroups 2 and 3 of table I herein;
I
≤
100 percent of initial reading or 250
nA dc, whichever is greater.
V
≤
±.1 V dc change from initial value.
Scope display evaluation (see 4.5.3)
JANS level
JANTXV and JANTX level
Required
Not required
Required (JANTXV only)
Not required
Required
Not applicable
Thermal impedance (see 4.3.1 and 4.4.1)
Not applicable
Not applicable
Not applicable
Not applicable
Optional
Not required
Not applicable
Method 1038 of
MIL-STD-750, condition A
V
F1
and I
R1
Required
Not applicable
Not applicable
Required, see 4.3.2
Subgroup 2 of table I herein;
I
≤
100 percent of initial reading or 250 nA
dc, whichever is greater.
V
F1
≤
±.1 V dc change from initial value.
Scope display evaluation (see 4.5.3)
Not applicable
Required
Not required
Not required
14a
(3) 14b
15
16
Not applicable
Required
Required
Required
(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in
accordance with MIL-PRF-19500, screen 3 prior to this thermal test.
(2) Z
θ
JX is not required in screen 13, if already previously performed.
(3)
For clear glass diodes, the hermetic seal (gross leak) may be performed at any time after
temperature cycling.
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相關(guān)代理商/技術(shù)參數(shù) |
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|---|---|
| JANKCA1N5551 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:This specification covers the performance requirements for silicon, general purpose, |
| JANKCA1N5552 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:This specification covers the performance requirements for silicon, general purpose, |
| JANKCA1N5553 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:This specification covers the performance requirements for silicon, general purpose, |
| JANKCA1N5554 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:This specification covers the performance requirements for silicon, general purpose, |
| JANKCA2N2484 | 制造商:STMICROELECTRONICS 制造商全稱:STMicroelectronics 功能描述:SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N2484, 2N2484UA, 2N2484UB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC |
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