參數(shù)資料
型號: K4B1G0446C
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 1Gb C-die DDR3 SDRAM Specification
中文描述: 1Gb的?芯片的DDR3 SDRAM規(guī)范
文件頁數(shù): 32/63頁
文件大?。?/td> 1255K
代理商: K4B1G0446C
Page 32 of 63
Rev. 1.0 June 2007
1Gb DDR3 SDRAM
K4B1G04(08/16)46C
Timing parameters are listed in the following table:
[ Table 33 ] For IDD testing the following parameters are utilized.
The following conditions apply:
1. IDD specifications are tested after the device is properly initialized.
2. Input slew rate is specified by AC Parametric test conditions.
3. IDD parameters are specified with ODT and output buffer disabled (MR1 Bit A12).
Parameter Bin
DDR3-800
DDR3-1066
DDR3-1333
Unit
6-6-6
7-7-7
8-8-8
8-8-8
9-9-9
t
CKmin
(IDD)
2.5
1.875
1.5
ns
CL(IDD)
6
7
8
8
9
t
RCDmin
(IDD)
15
13.13
15
12
13.5
ns
t
RCmin
(IDD)
52.5
50.63
52.50
48
49.5
ns
t
RASmin
(IDD)
37.5
37.5
37.5
36
36
ns
t
RPmin
(IDD)
15
13.13
15
12
13.5
ns
t
FAW
(IDD)
x4/x8
40
37.5
37.5
30
30
ns
x16
50
50
50
45
45
ns
t
RRD
(IDD)
x4/x8
10
7.5
7.5
6.0
6.0
ns
x16
10
10
10
7.5
7.5
ns
t
RFC
(IDD) - 1Gb
110
110
110
110
110
110
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