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參數(shù)資料
| 型號(hào)： | K4N51163QC-ZC2A |
| 廠商： | SAMSUNG SEMICONDUCTOR CO. LTD. |
| 英文描述： | 512Mbit gDDR2 SDRAM |
| 中文描述： | 512MB的GDDR2 SDRAM的 |
| 文件頁數(shù)： | 16/64頁 |
| 文件大?。?/td> | 1420K |
| 代理商： | K4N51163QC-ZC2A |
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Rev 1.5 Oct. 2005
512M gDDR2 SDRAM
K4N51163QC-ZC
19. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but system performance
(bus turnaround) will degrade accordingly.
20. MIN ( tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater
than the minimum specification limits for tCL and tCH). For example, tCL and tCH are = 50% of the period, less the half period jitter ( tJIT(HP)) of the
clock source, and less the half period jitter due to crosstalk ( tJIT(crosstalk)) into the clock traces.
21. tQH = tHP – tQHS, where:
tHP = minimum half clock period for any given cycle and is defined by clock high or clock low ( tCH, tCL).
tQHS accounts for:
1) The pulse duration distortion of on-chip clock circuits; and
2) The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next transition, both of which are, separately,
due to data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers.
22. tDQSQ: Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers as well as output slew rate
mismatch between DQS / DQS and associated DQ in any given cycle.
23. tDAL = (nWR) + ( tRP/tCK) :
For each of the terms above, if not already an integer, round to the next highest integer. tCK refers to the application clock period. nWR refers to the
tWR parameter stored in the MRS.
Example: For gDDR533 at t CK = 3.75 ns with tWR programmed to 4 clocks. tDAL = 4 + (15 ns / 3.75 ns) clocks =4 +(4)clocks=8clocks.
24. The clock frequency is allowed to change during self–refresh mode or precharge power-down mode. In case of clock frequency change during pre-
charge power-down, a specific procedure is required as described in gDDR2 device operation
25. ODT turn on time min is when the device leaves high impedance and ODT resistance begins to turn on.
ODT turn on time max is when the ODT resistance is fully on. Both are measured from tAOND.
26. ODT turn off time min is when the device starts to turn off ODT resistance.
ODT turn off time max is when the bus is in high impedance. Both are measured from tAOFD.
27. tHZ and tLZ transitions occur in the same access time as valid data transitions. These parameters are referenced to a specific voltage level which
specifies when the device output is no longer driving (tHZ), or begins driving (tLZ) . Following figure shows a method to calculate the point when
device is no longer driving (tHZ), or begins driving (tLZ) by measuring the signal at two different voltages. The actual voltage measurement points are
not critical as long as the calculation is consistent.
28. tRPST end point and tRPRE begin point are not referenced to a specific voltage level but specify when the device output is no longer driving (tRPST),
or begins driving (tRPRE). Following figure shows a method to calculate these points when the device is no longer driving (tRPST), or begins driving
(tRPRE) by measuring the signal at two different voltages. The actual voltage measurement points are not critical as long as the calculation is consis-
tent. These notes are referenced to the “Timing parameters by speed grade” tables for gDDR2-550/600/700 and gDDR2-800.
tHZ
tRPST end point
T1
T2
VOH + x mV
VOH + 2x mV
VOL + 2x mV
VOL + x mV
tLZ
tRPRE begin point
T2
T1
VTT + 2x mV
VTT + x mV
VTT - x mV
VTT - 2x mV
tLZ,tRPRE begin point = 2*T1-T2
tHZ,tRPST end point = 2*T1-T2
<Test method for tLZ, tHZ, tRPRE and tRPST>
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