參數(shù)資料
型號(hào)： K7N161845M
廠商： SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述： 512Kx36 & 1Mx18-Bit Pipelined NtRAMTM
中文描述： 512Kx36
文件頁(yè)數(shù)： 10/20頁(yè)
文件大小： 468K
代理商： K7N161845M
K7N163645M
K7N161845M
512Kx36 & 1Mx18 Pipelined N
t
RAM
TM
- 10 -
Rev 1.0
January 2000
ASYNCHRONOUS TRUTH TABLE
OPERATION
ZZ
OE
I/O STATUS
Sleep Mode
H
X
High-Z
Read
L
L
DQ
L
H
High-Z
Write
L
X
Din, High-Z
Deselected
L
X
High-Z
Notes
1. X means "Don
′
t Care".
2. Sleep Mode means power Sleep Mode of which stand-by current does
not depend on cycle time.
3. Deselected means power Sleep Mode of which stand-by current
depends on cycle time.
ABSOLUTE MAXIMUM RATINGS*
*Note
: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
PARAMETER
SYMBOL
RATING
UNIT
Voltage on V
DD
Supply Relative to V
SS
V
DD
-0.3 to 3.6
V
Voltage on Any Other Pin Relative to V
SS
V
IN
-0.3 to 3.6
V
Power Dissipation
P
D
1.6
W
Storage Temperature
T
STG
-65 to 150
°
C
°
C
°
C
Operating Temperature
T
OPR
0 to 70
Storage Temperature Range Under Bias
T
BIAS
-10 to 85
OPERATING CONDITIONS
(0
°
C
≤
T
A
≤
70
°
C)
*Note
: V
DD
and V
DDQ
must be supplied with identical vlotage levels
.
PARAMETER
SYMBOL
MIN
Typ.
MAX
UNIT
Supply Voltage
V
DD
2.375
2.5
2.625
V
V
DDQ
2.375
2.5
2.625
V
Ground
V
SS
0
0
0
V
CAPACITANCE*
(T
A
=25
°
C, f=1MHz)
*Note
: Sampled not 100% tested.
PARAMETER
SYMBOL
TEST CONDITION
MIN
MAX
UNIT
Input Capacitance
C
IN
V
IN
=0V
-
7
pF
Output Capacitance
C
OUT
V
OUT
=0V
-
9
pF
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