參數(shù)資料
型號(hào): KFG5616Q1M
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: OneNAND256
中文描述: OneNAND256
文件頁(yè)數(shù): 74/93頁(yè)
文件大?。?/td> 1223K
代理商: KFG5616Q1M
OneNAND256
FLASH MEMORY
74
9. DC CHARACTERISTICS
1. CE should be VIH for RDY. IOBE should be ’0’ for INT.
2. Icc active for Host access
3. ICC active while Internal operation is in progress.
Parameter
Symbol
Test Conditions
1.8V device
2.65V device
3.3V device
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Input Leakage Current
I
LI
V
IN
=V
SS
to V
CC
, V
CC
=V
CCmax
- 1.0
-
+ 1.0 - 1.0
-
+ 1.0 - 1.0
-
+ 1.0
μ
A
Output Leakage Cur-
rent
I
LO
V
OUT
=V
SS
to V
CC
, V
CC
=V
CCmax
,
CE or OE=V
IH
(Note 1)
- 1.0
-
+ 1.0 - 1.0
-
+ 1.0 - 1.0
-
+ 1.0
μ
A
Active Asynchronous
Read Current (Note 2)
I
CC1
CE=V
IL
, OE=V
IH
-
8
15
-
10
20
-
10
20
mA
Active Burst Read Cur-
rent (Note 2)
I
CC2
CE=V
IL
, OE=V
IH
54MHz
-
12
20
-
20
30
-
20
30
mA
1MHz
-
3
4
-
4
6
-
4
6
mA
Active Write Current
(Note 2)
I
CC3
CE=V
IL
, OE=V
IH
-
8
15
-
10
20
-
10
20
mA
Active Load Current
(Note 3)
I
CC4
CE=V
IL
, OE=V
IH
, WE=V
IH,
V
IN
=V
IH
or
V
IL
-
20
25
-
20
30
-
20
30
mA
Active Program Cur-
rent (Note 3)
I
CC5
CE=V
IL
, OE=V
IH
, WE=V
IH,
V
IN
=V
IH
or
V
IL
-
20
25
-
20
30
-
20
30
mA
Erase/Multi Block
Erase Current (Note 3)
I
CC6
CE=V
IL
, OE=V
IH
, WE=V
IH
,
V
IN
=V
IH
or
V
IL,
64blocks
-
15
20
-
18
25
-
18
25
mA
Standby Current
I
SB
CE= RP=V
CC
±
0.2V
-
10
50
-
15
50
-
15
50
μ
A
Input Low Voltage
V
IL
-
-0.5
-
0.4
-0.5
-
0.4
0
-
0.8
V
Input High Voltage
V
IH
-
V
CCq
-
0.4
-
V
CCq
+0.4
V
CCq
-
0.4
-
V
CCq
+0.4
0.7*V
CCq
-
V
CCq
V
Output Low Voltage
V
OL
I
OL
= 100
μ
A , V
CC
=V
CCmin
,
V
CCq
=V
CCqmin
-
-
0.2
-
-
0.2
-
-
0.22*
Vccq
V
Output High Voltage
V
OH
I
OH
= -100
μ
A , V
CC
=V
CCmin
,
V
CCq
=V
CCqmin
V
CCq
-
0.1
-
-
V
CCq
-
0.4
-
-
0.8*V
CCq
-
-
V
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