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參數(shù)資料
| 型號： | KFM1216Q2M-DED |
| 廠商： | SAMSUNG SEMICONDUCTOR CO. LTD. |
| 英文描述： | FLASH MEMORY |
| 中文描述： | 閃存 |
| 文件頁數(shù)： | 68/88頁 |
| 文件大?。?/td> | 1150K |
| 代理商： | KFM1216Q2M-DED |
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MuxOneNAND512(KFM1216Q2M)
FLASH MEMORY
68
Technical Notes
(Continued)
Error in write or load operation
Within its life time, additional invalid blocks may develop with NAND Flash memory. Refer to the qualification report for the actual
data.The following possible failure modes should be considered to implement a highly reliable system. In the case of status read fail-
ure after erase or program, block replacement should be done. Because program status fail during a page program does not affect
the data of the other pages in the same block, block replacement can be executed with a page-sized buffer by finding an erased
empty block and reprogramming the current target data and copying the rest of the replaced block.
Failure Mode
Detection and Countermeasure sequence
Write
Erase Failure
Status Read after Erase --> Block Replacement
Program Failure
Status Read after Program --> Block Replacement
Load
Single Bit Failure
ECC Correction by ECC mode of the device
Block Replacement
When an error happens in the nth page of the Block ’A’ during program operation.
* Step1
Then, copy the data in the 1st ~ (n-1)th page to the same location of the Block ’B’ via data buffer0.
* Step2
Copy the nth page data of the Block ’A’ in the data buffer1 to the nth page of another free block. (Block ’B’)
Do not further erase or program Block ’A’ but create an ’invalid Block’ table or other appropriate scheme.
Data Buffer1 of the device
(assuming maintain the nth page data)
1st
Block A
Block B
(n-1)th
nth
(page)
{
1st
～
(n-1)th
nth
(page)
{
an error occurs.
1
2
Data Buffer0 of the device
1
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