參數(shù)資料
型號: NCT75MNR2G
廠商: ON Semiconductor
文件頁數(shù): 3/15頁
文件大小: 181K
描述: IC SENSOR TEMP DGTL 8DFN
標(biāo)準(zhǔn)包裝: 3,000
功能: 溫度監(jiān)控系統(tǒng)(傳感器)
傳感器類型: 內(nèi)部
感應(yīng)溫度: -55°C ~ 125°C
精確度: ±3°C
拓?fù)洌?/td> ADC(三角積分型),控制邏輯,寄存器庫
輸出類型: 2 線串行,I²C?/SMBUS?
輸出警報(bào):
輸出風(fēng)扇:
電源電壓: 3 V ~ 5.5 V
工作溫度: -55°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 8-VFDFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 8-DFN(2x2)
包裝: 帶卷 (TR)
NCT75
http://onsemi.com
3
Table 2. ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Supply Voltage
V
DD
0.3 to +7
V
Input Voltage on SCL, SDA, A2, A1, A0 and OS
/ALERT
.
0.3 to V
DD
 + 0.3
V
Input Current on SDA, A2, A1, A0 and OS
/ALERT
.
I
IN
1 to +50
mA
Maximum Junction Temperature
T
J(max)
150.7
Operating Temperature Range
T
OP
55 to 125
Storage Temperature Range
T
STG
65 to 160
ESD Capability, Human Body Model (Note 1)
ESD
HBM
2,000
V
ESD Capability, Machine Model (Note 1)
ESD
MM
400
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1.  This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per AECQ100002 (EIA/JESD22A114)
ESD Machine Model tested per AECQ100003 (EIA/JESD22A115)
Table 3. OPERATING RANGES
Rating
Symbol
Min
Max
Unit
Operating Supply Voltage
V
IN
3.0
5.5
V
Operating Ambient Temperature Range
T
A
55
125
Table 4. SMBus TIMING SPECIFICATIONS
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Serial Clock Frequency
f
SCL
DC

400
kHz
Start Condition Hold Time
t
HD:STA
0.6


ms
Stop Condition Setup Time
t
SU:STO
90% of SCL to 10% of SDA
100


ns
Clock Low Period
t
LOW
1.3


ms
Clock High Period
t
HIGH
0.6


ms
Start Condition Setup Time
t
SU:STA
90% of SCL to 90% of SDA
100


ns
Data Setup Time
t
SU:DAT
10% of SDA to 10% of SCL
100


ns
Data Hold Time (Note 2)
t
HD:DAT
10% of SCL to 10% of SDA
0

76
ns
SDA/SCL Rise Time
t
R

300

ns
SDA/SCL Fall Time
t
F

300

ns
Minimum RESET Pulse Width
t
RESET
1.3


ms
Bus Free Time Between STOP
and START Conditions
t
BUF
1.3


ms
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
2.  This refers to the hold time when the NCT75 is writing data to the bus.
SCL
SDA
STOP  START
STOP
START
Figure 3. Serial Interface Timing
t
BUF
t
SU;STA
t
HD;STA
t
SU;STO
t
SU;DAT
t
HD;DAT
t
HD;STA
t
F
t
R
t
HIGH
t
LOW
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