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Rev.1.10
- 11 -
s TEST CIRCUITS
ISS
VDD
OUT
GND
VIN
R3111X
Series
R3111X
Series
VDD
VOUT
5.0V
OUT
GND
VIN
470K
*Pull-up circuit is not necessary for
CMOS Output type, or R3111XXXXC
.
Figure 3. Supply Current Test Circuit
Figure 4. Detector Threshold Test Circuit
VDD
VDS
OUT
IOUT
GND
VIN
R3111X
Series
R3111X
Series
VDD
VDD- VDS
VDS
OUT
IOUT
GND
VIN
*Apply only to CMOS
Figure 5. Nch Driver Output Current Test Circuit
Figure 6. Pch Driver Output Current Test Circuit
VDD
VSS
OUT
GND
P.G.
R3111XXX1A
Series
470K
COUT
+5.0V
0.7V
ROUT
+VDET+2.0V
OUT
P.G.
VDD
VSS
OUT
GND
R3111XXX1A
Series
470K
100K
CIN
+5.0V
0.7V
ROUT
RIN
+VDET+2.0V
Figure 7. Output Delay Time Test Circuit (1)
Figure 8. Output Delay Time Test Circuit (2)