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參數(shù)資料
| 型號(hào)： | μPD78064Y |
| 廠商： | NEC Corp. |
| 英文描述： | 8 Bit Single Chip Microcontrollers(8位單片微控制器) |
| 中文描述： | 8位單片機(jī)微控制器（8位單片微控制器） |
| 文件頁(yè)數(shù)： | 64/68頁(yè) |
| 文件大?。?/td> | 444K |
| 代理商： | ΜPD78064Y |
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64
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PD78062Y, 78063Y, 78064Y
Development Tools Documents (User's Manual) (2/2)
Document Name
Document No.
Japanese
English
SM78K Series System Simulator
External Components User Open
Interface
U10092J
U10092E
SM78K0 System Simulator Windows Based
Reference
U10181J
U10181E
ID78K0 Integrated Debugger EWS Based
Reference
U11515J
—
ID78K0 Integrated Debugger PC Based
Reference
U11539J
U11539E
ID78K0 Integrated Debugger Windows Based
Guide
U11649J
U11649E
SD78K/0 Screen Debugger
Introduction
EEU-852
U10539E
PC-9800 Series (MS-DOS) Based
Reference
U10952J
—
SD78K/0 Screen Debugger
Introduction
EEU-5024
EEU-1414
IBM PC/AT (PC DOS) Based
Reference
U11279J
U11279E
Embedded Software Documents (User's Manual)
Document Name
Document No.
Japanese
English
78K/0 Series Real-Time OS
Fundamental
U11537J
—
Installation
U11536J
—
78K/0 Series OS MX78K0
Fundamental
U12257J
—
Fuzzy Knowledge Data Creation Tool
EEU-829
EEU-1438
78K/0, 78K/II, 87AD Series
EEU-862
EEU-1444
Fuzzy Inference Development Support System - Translator
78K/0 Series Fuzzy Inference Development Suport System
EEU-858
EEU-1441
- Fuzzy Inference Module
78K/0 Series Fuzzy Inference Development Support System
EEU-921
EEU-1458
- Fuzzy Inference Debugger
Other Documents
Document Name
Document No.
Japanese
English
IC Package Manual
C10943X
Semiconductor Device Mounting Technology Manual
C10535J
C10535E
Quality Grades on NEC Semiconductor Device
C11531J
C11531E
NEC Semiconductor Device Reliability/Quality Control System
C10983J
C10983E
Electrostatic Discharge (ESD) Test
MEM-539
—
Guide to Quality Assurance for Semiconductor Device
C11893J
MEI-1202
Guide for Products Related to Micro-Computer: Other Companies
U11416J
—
Caution
The contents of the above related documents are subject to change without notice. The latest
documents should be used for design, etc.
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