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參數(shù)資料
| 型號： | 100304QCX |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | AND/NAND and AND-NOR Gate |
| 中文描述： | 100K SERIES, 5 2-INPUT AND/NAND GATE, PQCC28 |
| 封裝： | 0.450 X 0.450 INCH, PLASTIC, MO-047, LCC-28 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 109K |
| 代理商： | 100304QCX |
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
0.30
T
C
= +25C
Min
0.40
T
C
= +125C
Min
0.30
Units
Conditions
Notes
Max
1.90
Max
1.80
Max
2.30
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Propagation Delay
D
na
–D
ne
to O, O
Propagation Delay
Data to F
Transition Time
20% to 80%, 80% to 20%
ns
(Notes 7, 8, 9)
0.80
2.90
0.90
2.80
0.90
3.40
ns
Figures 1, 2
0.20
1.80
0.30
1.60
0.20
2.00
ns
(Note 10)
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each mfg. lot at +25C, Subgroup A9, and at +125C and 55C temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C, and 55C temperature (design characterization data).
Test Circuitry
DS100304-5
Notes:
V
, V
= +2V, V
= 2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
≤
3 pF
FIGURE 1. AC Test Circuit
www.national.com
4
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| 100304QI | 功能描述:邏輯門 Quint AND/NAND Gate RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
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