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參數(shù)資料
| 型號： | 100313 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | Low Power Quad Driver |
| 中文描述： | 低功耗四驅(qū)動器 |
| 文件頁數(shù)： | 2/6頁 |
| 文件大?。?/td> | 119K |
| 代理商： | 100313 |
Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
ESD (Note 2)
Military Version
DC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND, T
C
= 55C to +125C
Symbol
Parameter
V
OH
Output HIGH Voltage
65C to +150C
+175C
7.0V to +0.5V
V
EE
to +0.5V
50 mA
≥
2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
Note 1:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
55C to +125C
5.7V to 4.2V
Min
1025
1085
1830 1620
1830 1555
1035
1085
Max
870
Units
mV
mV
mV
mV
mV
mV
mV
mV
mV
T
C
Conditions
Notes
0C to +125C
55C
0C to +125C
55C
0C to +125C
55C
0C to +125C
55C
55C to +125C
V
IN
=V
IH (Max)
or V
IL(Min)
Loading with
50
to 2.0V
(Notes 3, 4,
5)
V
OL
Output LOW Voltage
V
OHC
Output HIGH Voltage
V
IN
=V
IH (Min)
or V
IL (Max)
Loading with
50
to 2.0V
(Notes 3, 4,
5)
V
OLC
Output LOW Voltage
1610
1555
870
V
IH
Input HIGH Voltage
1165
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
EE
= 4.2V
V
IN
= V
IL (Min)
(Notes 3, 4,
5, 6)
V
IL
Input LOW Voltage
1830 1475
mV
55C to +125C
(Notes 3, 4,
5, 6)
I
IL
Input LOW Current
0.50
μA
55C to +125C
(Notes 3, 4,
5)
I
IH
Input HIGH Current
Data
Enable
Data
Enable
350
240
500
340
20
μA
0C to +125C
V
EE
= 5.7V
V
IN
= V
IH (Max)
(Notes 3, 4,
5)
μA
55C
I
EE
Power Supply Current
65
mA
55C to +125C
Inputs Open
(Notes 3, 4,
5)
Note 3:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4:
Screen tested 100% on each device at 55C, +25C, and +125C, Subgroups 1, 2, 3, 7, and 8.
Note 5:
Sample tested (Method 5005, Table I) on each manufactured lot at 55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8.
Note 6:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
www.national.com
2
PrintDate=1998/08/31 PrintTime=07:05:03 45028 ds100297 Rev. No. 1
cmserv
Proof
2
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| 100313PC | Low Power Quad Driver |
| 100314 | Low Power Quint Differential Line Receiver |
| 100314D | UK 4-EX BKYE-FE |
| 100314F | Low Power Quint Differential Line Receiver |
| 100314SC | Low Power Quint Differential Line Receiver |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| 100313/E ZAC3025T WAF | 制造商:Texas Instruments 功能描述: |
| 100313_ZAC3026T WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
| 1003130000 | 制造商:Weidmuller 功能描述:CONN ENCLOSURE SIZE HQ |
| 1003-132 | 制造商:Megger 功能描述:TEST LEAD, STANDARD |
| 10031333 | 制造商:ALWAYSE ENGINEERING 功能描述:BOLT FITTING BTU 25MM |
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