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參數(shù)資料
| 型號(hào)： | 100323 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | Low Power Hex Bus Driver |
| 中文描述： | 低功耗六角總線驅(qū)動(dòng)程序 |
| 文件頁(yè)數(shù)： | 3/8頁(yè) |
| 文件大?。?/td> | 110K |
| 代理商： | 100323 |
Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature
Maximum Junction Temperature
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output High)
ESD
65C to +150C
+175C
7.0V to +0.5V
V
EE
to +0.5V
50 mA
≥
2000V
Recommended Operating
Conditions
Case Temperature
Military
Supply Voltage (V
EE
)
Note 1:
Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
55C to +125C
5.7V to 4.2V
Military Version
DC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND, T
C
= 55C to +125C
Symbol
Parameter
Min
V
OH
Output HIGH
1025
Voltage
1085
V
OHC
Output HIGH
1035
Voltage
1085
V
OLC
Output LOW
Voltage
V
OLZ
Cut-Off LOW
Voltage
V
IH
Input HIGH
1165
Voltage
V
IL
Input LOW
1830
Voltage
I
IL
Input LOW
Current
I
IH
Input HIGH
Current
I
EE
Power Supply
Current
155
Max
870
870
Units
mV
mV
mV
mV
mV
MV
mV
T
C
Conditions
Notes
0C to +125C
55C
0C to +125C
55C
0C to +125C
55C
0C to +125C
55C
55C to +125C
V
IN
= V
IH (max)
or V
IL (min)
V
IN
= V
IH (min)
or V
IL (max)
Loading with
25
to 2.0V
Loading with
25
to 2.0V
(Notes 3, 4, 5)
(Notes 3, 4, 5)
1610
1555
1950
1850
870
V
IN
= V
IH (min)
or V
IL (max)
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
EE
= 4.2V, V
IN
= V
IL (min)
Loading with
25
to 2.0V
(Notes 3, 4, 5)
mV
(Notes 3, 4, 5, 6)
1475
mV
55C to +125C
(Notes 3, 4, 5, 6)
0.50
μA
55C to +125C
(Notes 3, 4, 5)
240
340
μA
μA
0C to +125C
55C
V
EE
= 5.7V, V
IN
= V
IH (max)
(Notes 3, 4, 5)
Inputs Open
V
EE
= 4.2V to 5.7V
53
mA
55C to +125C
(Notes 3, 4, 5)
Note 3:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4:
Screen tested 100% on each device at 55C, +25C, and +125C, Subgroups 1, 2, 3, 7, and 8.
Note 5:
Sample tested (Method 5005, Table I) on each manufactured lot at 55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8.
Note 6:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
www.national.com
3
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