參數(shù)資料
型號(hào): 100336SCX
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: 通用總線功能
英文描述: Counter/Shift Register
中文描述: 100K SERIES, SYN POSITIVE EDGE TRIGGERED 4-BIT BIDIRECTIONAL BINARY COUNTER, PDSO24
封裝: 0.300 INCH, MS-013, SOIC-24
文件頁數(shù): 5/16頁
文件大?。?/td> 318K
代理商: 100336SCX
Absolute Maximum Ratings
(Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
ESD (Note 3)
Military Version
DC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND, T
C
= 55C to +125C
Symbol
Parameter
V
OH
Output HIGH Voltage
65C to +150C
+175C
7.0V to +0.5V
V
EE
to +0.5V
50 mA
2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
Note 2:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3:
ESD testing conforms to MIL-STD-883, Method 3015.
55C to +125C
5.7V to 4.2V
Min
1025
Max
870
Units
mV
T
C
Conditions
Notes
0C to
+125C
55C
0C to
+125C
55C
0C to
+125C
55C
0C to
+125C
55C
55C to
+125C
55C to
+125C
55C to
+125C
0C to
+125C
55C
55C
to
+125C
V
IN
= V
IH (Max)
or V
IL (Min)
Loading with
50
to 2.0V
1085
1830
870
1620
mV
mV
(Notes 4, 5, 6)
V
OL
Output LOW Voltage
1830
1035
1555
mV
mV
V
OHC
Output HIGH Voltage
V
IN
= V
IH (Min)
or V
IL (Max)
Loading with
50
to 2.0V
1085
mV
mV
(Notes 4, 5, 6)
V
OLC
Output LOW Voltage
1610
1555
870
mV
mV
V
IH
Input HIGH Voltage
1165
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
EE
= 4.2V
V
IN
= V
IL (Min)
V
EE
= 5.7V
V
IN
= V
IH(Max)
(Notes 4, 5, 6, 7)
V
IL
Input LOW Voltage
1830
1475
mV
(Notes 4, 5, 6, 7)
I
IL
Input LOW Current
0.50
μA
(Notes 4, 5, 6)
I
IH
Input HIGH Current
240
μA
(Notes 4, 5, 6)
340
μA
I
EE
Power Supply Current
Inputs Open
V
EE
= 4.2V to 4.8V
V
EE
= 4.2V to 5.7V
185
195
70
70
mA
(Notes 4, 5, 6)
Note 4:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stablize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 5:
Screen tested 100% on each device at 55C, +25C, and +125C, Subgroups 1, 2, 3, 7, and 8.
Note 6:
Sample tested (Method 5005, Table I) on each manufactured lot at 55C, +25C, +125C, Subgroups A1, 2, 3, 7, and 8.
Note 7:
Guaranteed by applying specified input conditon and testing V
OH
/V
OL
.
5
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