參數(shù)資料
型號(hào): 100344F
廠商: National Semiconductor Corporation
元件分類: 通用總線功能
英文描述: Low Power 8-Bit Latch with Cut-Off Drivers
中文描述: 低功耗8位鎖存器的截止點(diǎn)驅(qū)動(dòng)
文件頁數(shù): 4/8頁
文件大?。?/td> 170K
代理商: 100344F
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
0.50
T
C
= +25C
Min
0.70
T
C
= +125C
Min
0.70
Units
Conditions
Notes
Max
2.60
Max
2.60
Max
3.10
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PHZ
t
TLH
t
THL
Propagation Delay
D
n
to Output
Propagation Delay
LE, E to Output
Propagation Delay
OEN to Output
Transition Time
20% to 80%, 80% to
20%
Setup Time
ns
Figures 1, 2
(Notes 8, 9,
10, 12)
0.80
3.30
1.00
3.30
1.10
3.80
ns
Figures 1, 4
(Notes 8, 9,
10, 12)
1.00
0.70
0.40
4.60
3.00
2.50
1.10
0.70
0.40
4.20
2.80
2.40
1.20
0.70
0.40
4.40
3.20
2.70
ns
Figures 1, 2
(Notes 8, 9,
10, 12)
ns
Figures 1, 3
(Note 11)
t
s
(Note 11)
D
0
–D
7
1.50
1.50
1.70
ns
Figures 1, 3
t
h
Hold Time
(Note 11)
D
0
–D
7
0.60
0.60
0.60
ns
Figures 1, 3
t
pw
(H)
Pulse Width HIGH
(Note 11)
LE, E
2.40
2.40
2.40
ns
Figures 1, 3
Note 8:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 9:
Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 10:
Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and 55C temperatures, Subgroups A10 and A11.
Note 11:
Not tested at +25C, +125C, and 55C temperature (design characterization data).
Note 12:
The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.
Test Circuitry
DS100317-6
Notes:
V
, V
= +2V, V
= 2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 25
to GND
C
L
= Fixture and stray capacitance
3 pF
FIGURE 1. AC Test Circuit
www.national.com
4
相關(guān)PDF資料
PDF描述
100344 Low Power 8-Bit Latch with Cut-Off Drivers
100344PC Low Power 8-Bit Latch with Cut-Off Drivers
100344QC Low Power 8-Bit Latch with Cut-Off Drivers
100344QI Low Power 8-Bit Latch with Cut-Off Drivers
100344QCX 8-Bit D-Type Latch
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