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參數(shù)資料
| 型號： | 100352 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | Low Power 8-Bit Buffer with Cut-Off Drivers |
| 中文描述： | 低功耗8位緩沖割關(guān)閉驅(qū)動程序 |
| 文件頁數(shù)： | 5/8頁 |
| 文件大小： | 143K |
| 代理商： | 100352 |
AC Electrical Characteristics
(Continued)
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
0.40
T
C
= +25C
Min
0.40
T
C
+125C
Min
0.40
Units
Conditions
Notes
Max
2.50
Max
2.40
Max
2.70
t
TLH
t
THL
Transition Time
20% to 80%, 80% to 20%
ns
Figures 1, 2
(Note 10)
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and 55C temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C, and 55C temperature (design characterization data).
Note 11:
The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.
Test Circuitry
Switching Waveforms
DS100296-6
Notes:
V
CC
, V
CCA
= +2V, V
EE
= 2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 25
to GND
C
L
= Fixture and stray capacitance
≤
3 pF
FIGURE 1. AC Test Circuit
DS100296-7
Note:
The output AC measurement point for cut-off propagation delay
testing = the 50% voltage point between active V
OL
and V
OH
.
FIGURE 2. Propagation Delay, Cut-Off and Transition Times
www.national.com
5
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