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參數(shù)資料
| 型號： | 1032 |
| 廠商： | Lattice Semiconductor Corporation |
| 英文描述： | In-System Programmable High Density PLD |
| 中文描述： | 在系統(tǒng)可編程高密度可編程邏輯器件 |
| 文件頁數(shù)： | 4/12頁 |
| 文件大小： | 151K |
| 代理商： | 1032 |
Specifications
ispLSI 1032/883
4
Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Time
≤
3ns 10% to 90%
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
1.5V
Output Load
See figure 2
3-state levels are measured 0.5V from steady-state
active level.
Table 2- 0003
Output Load Conditions (see figure 2)
Test Condition
R1
R2
CL
A
470
∞
390
390
390
390
35pF
B
Active High
35pF
Active Low
470
∞
35pF
Active High to Z
at
V
OH
- 0.5V
Active Low to Z
at
V
OL
+ 0.5V
5pF
C
470
390
5pF
Figure 2. Test Load
+ 5V
R1
R2
CL
*
Device
Output
Test
Point
*
CL includes Test Fixture and Probe Capacitance.
DC Electrical Characteristics
Over Recommended Operating Conditions
0.4
–
-10
10
-150
-150
-200
220
V
OL
V
OH
I
IL
I
IH
I
IL-isp
I
IL-PU
I
OS
1
I
CC
2,4
I
OL
=8 mA
I
OH
=-4 mA
0V
≤
V
IN
≤
V
IL
(MAX.)
3.5V
≤
V
IN
≤
V
CC
0V
≤
V
IN
≤
V
IL
(MAX.)
0V
≤
V
IN
≤
V
IL
V
CC
= 5V, V
OUT
= 0.5V
V
IL
= 0.5V, V
IH
= 3.0V
f
TOGGLE
= 1 MHz
–
–
–
–
–
–
–
135
–
2.4
–
–
–
–
–
–
CONDITION
PARAMETER
SYMBOL
MIN.
MAX.
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
isp Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
UNITS
TYP.
3
V
V
μ
A
μ
A
μ
A
μ
A
mA
mA
1. One output at a time for a maximum duration of one second. V
out
= 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2. Measured using six16-bit counters.
3. Typical values are at V
= 5V and T
= 25
o
C.
4. Maximum I
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption sec-
tion of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum
I
CC
.
0007A-32 mil
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