參數(shù)資料
型號(hào)： 1101B85M00000AG
廠商： VECTRON INTERNATIONAL
元件分類(lèi)： XO, clock
英文描述： CRYSTAL OSCILLATOR, CLOCK, 85 MHz, ACMOS OUTPUT
封裝： PLASTIC, FLAT PACKAGE-12
文件頁(yè)數(shù)： 19/22頁(yè)
文件大?。?/td> 468K
代理商： 1101B85M00000AG
SIZE
CODE IDENT NO.
UNSPECIFIED TOLERANCES
DWG NO.
REV.
SHEET
A
00136
N/A
OS-68338
K
6
4.3.4.1 Frequency Aging Duration Option. By customer request, the Aging test may be terminated
after 15 days if the measured aging rate is less than half of the specified aging rate. This is a
common method of expediting 30-Day Aging without incurring risk to the hardware and used
quite successfully for numerous customers. It is based on the ‘least squares fit’ determinations
of MIL-PRF-55310 paragraph 4.8.35. The ‘half the time/half the spec’ limit is generally
conservative as roughly 2/3 of a unit’s Aging deviation occurs within that period of time.
Vectron’s automated aging systems take about 6 data points per day, so a lot of data is
available to do very accurate projections, much more data than what is required by MIL-PRF-
55310. The delivered data would include the Aging plots projected to 30 days. If the units
would not perform within that limit then they would continue to full 30 Day term. Please
advise by purchase order text if this may be an acceptable option to exercise as it assists in
Production Test planning.
4.3.5
Operating Characteristics. Symmetrical square wave limits are dependent on the device
frequency and are in accordance with Tables 2 and 2A. Waveform measurement points and
logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec. maximum.
4.3.6
Output Load. Standard TTL (6 or 10) and ACMOS (10k , 15pF) test loads are in accordance
with MIL-PRF-55310.
5.
QUALITY ASSURANCE PROVISIONS AND VERIFICATION
5.1
Verification and Test. Device lots shall be tested prior to delivery in accordance with the
applicable Screening Option letter as stated by the 15
th character of the part number. Table 5
tests are conducted in the order shown and annotated on the appropriate process travelers and
data sheets of the governing test procedure. For devices that require Screening Options that
include MIL-PRF-55310 Group A testing, the Post-Burn-In Electrical Test and the Group A
Electrical Test are combined into one operation.
5.1.1
Screening Options. The Screening Options, by letter, are summarized as:
A
Modified MIL-PRF-38534 Class K
B
Modified MIL-PRF-55310 Class B Screening & Group A Quality Conformance
Inspection (QCI)
C
Modified MIL-PRF-55310 Class S Screening & Group A QCI
D
Modified MIL-PRF-38534 Class K with Burn-in Delta Aging
E
Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI
F
Modified MIL-PRF-55310 Class S Screening, Groups A & B QCI
G
Modified MIL-PRF-55310 Class B Screening & Post Burn-in Nominal
Electricals
X
Engineering Model (EM)
5.2
Optional Design, Test and Data Parameters. The following is a list of design, assembly,
inspection and test options that can be selected or added by purchase order request.
相關(guān)PDF資料
PDF描述
1101B85M00000BE CRYSTAL OSCILLATOR, CLOCK, 85 MHz, ACMOS OUTPUT
1101C10M00000AD CRYSTAL OSCILLATOR, CLOCK, 10 MHz, ACMOS OUTPUT
1101C24M00000AB CRYSTAL OSCILLATOR, CLOCK, 24 MHz, ACMOS OUTPUT
1107E4M00000AX CRYSTAL OSCILLATOR, CLOCK, 4 MHz, TTL OUTPUT
1107E4M00000BF CRYSTAL OSCILLATOR, CLOCK, 4 MHz, TTL OUTPUT
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