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參數(shù)資料
| 型號(hào)： | 1105DFREQ3AE |
| 廠商： | VECTRON INTERNATIONAL |
| 元件分類： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 24 MHz - 100 MHz, ACMOS OUTPUT |
| 封裝： | DIP-14 |
| 文件頁數(shù)： | 14/19頁 |
| 文件大?。?/td> | 1082K |
| 代理商： | 1105DFREQ3AE |
SIZE
CODE IDENT NO.
UNSPECIFIED TOLERANCES
DWG NO.
REV.
SHEET
A
00136
N/A
OS-68338
I
4
in accordance with MIL-PRF-38534, as a minimum. Tabulated records are provided as a part
of the deliverable data package. Devices are handled in accordance with MIL-STD-1686 for
Class 1 devices.
3.4.4 Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered to
this document. Inspection conditions and standards are documented in accordance with the
Quality Assurance, ISO-9001 derived, System of QSP-90100.
3.4.5 Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing to
eliminate costs associated with the development/maintenance of device-specific documentation
packages while maintaining performance integrity.
3.4.6 Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.
3.4.7 Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see 5.2) use the
same robust designs found in the other device pedigrees. They do not include the provisions of
traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.
4.
DETAIL REQUIREMENTS
4.1
Components
4.1.1 Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for the
devices. The optional use of Premium Q swept quartz can, because of its processing to remove
impurities, be specified for better frequency aging characteristics. In accordance with MIL-
PRF-55310, the manufacturer has a documented crystal element evaluation program.
4.1.2 Passive Components. Established Reliability (ER) failure level R passive components are
procured from QPL suppliers. Lot evaluations are in accordance with MIL-PRF-55310.
4.1.3 Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-PRF-
55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class 2 ESDS
classification in accordance with MIL-PRF-38535. When optionally specified, further testing
in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for radiation hardness
assurance. Those microcircuits, identified by a unique part number, are certified for
100krad(Si) total ionizing dose (TID), RHA level R (2X minimum margin). NSC, as the
54ACT designer, rates the SEU LET at >40 MeV and SEL at >120MeV for the FACT
family (AN-932). Our wafer testing does not include these parameters and determinations, but
by design similarity.
4.1.3.1 Class B Microcircuits. When specified, microcircuits assembled into OS-68338 Design
Pedigree letters “B” and “C” devices ( 5.2a) are procured from wafer lots that have passed
MIL-PRF-55310 element evaluations for Class B devices.
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