參數(shù)資料
型號(hào)： 1112VFREQ2BD
廠商： VECTRON INTERNATIONAL
元件分類： XO, clock
英文描述： CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, TTL OUTPUT
封裝： PLASTIC, CERAMIC PACKAGE-20
文件頁(yè)數(shù)： 20/22頁(yè)
文件大小： 468K
代理商： 1112VFREQ2BD
SIZE
CODE IDENT NO.
UNSPECIFIED TOLERANCES
DWG NO.
REV.
SHEET
A
00136
N/A
OS-68338
K
7
a. Design Pedigree (choose one as the 5
th character in the part number):
(E) Enhanced Element Evaluation, 100krad Class S die, Premium Q Swept Quartz
(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz
(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz
(X) Hi-Rel design w/ Cultured Quartz, Class S die
(B) Hi-Rel design w/ Swept Quartz, Class B die
(C) Hi-Rel design w/ Cultured Quartz, Class B die
(D) Hi-Rel design w/ Cultured Quartz and commercial grade components
b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14
th character
c. Frequency-Temperature Slew Test
d. Radiographic Inspection
e. Group C Inspection: MIL-PRF-55310 (requires 8 pc. sample)
f. Group C Inspection: MIL-PRF-38534 (requires 8 pc. sample – 5 pc. Life, 3 pc. RGA)
g. Internal Water-Vapor Content (RGA) samples and test performance
h. MTBF Reliability Calculations
i. Worst Case/Derating Analysis
j. Deliverable Process Identification Documentation (PID)
k. Customer Source Inspection (pre-cap / final)
5.3
Test Conditions. Unless otherwise stated herein, inspections are performed in accordance with
those specified in MIL-PRF-55310 and MIL-PRF-38534, in that order. Process travelers
identify the applicable methods, conditions and procedures to be used. Examples of electrical
test procedures that correspond to MIL-PRF-55310 requirements are shown in Table 3.
5.4
Special Tests and Descriptions.
5.4.1
Frequency-Temperature Slew. Frequency-Temperature Slew Test has been developed as an
indicator of higher than normal internal water vapor content. The incremental temperature
sweep from +125°C to -55°C and back to +125°C records output frequency fluctuations
emulating the mass loading of moisture deposited on the crystal blank surface. Though not
replacing a customer’s internal water-vapor content (RGA) requirement, confidence is
increased without destructively testing otherwise good devices.
5.4.2
Burn-in Delta Frequency Aging (in Option D). The frequency measurement for burn-in delta
measurements is performed at the crystal’s upper turning point temperature where its effects on
repeatable frequency accuracy are maximized. Dependent on the crystal specified, this
temperature is typically between +65°C and +85°C, ±0.2°C.
5.5
Deliverable Data. The manufacturer supplies the following data, as a minimum, with each lot
of devices:
a. Completed assembly and screening lot travelers, including rework history.
b. Electrical test variables data, identified by unique serial number.
c. Frequency-Temperature Slew plots, Radiographic films, Group C data and RGA data as
required by purchase order.
相關(guān)PDF資料
PDF描述
1112VFREQ2BE CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, TTL OUTPUT
1113BFREQ2AG CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, ACMOS OUTPUT
1113DFREQ2AC CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, ACMOS OUTPUT
1113DFREQ2AE CRYSTAL OSCILLATOR, CLOCK, 12 MHz - 100 MHz, ACMOS OUTPUT
1115CFREQ1AD CRYSTAL OSCILLATOR, CLOCK, 0.35 MHz - 12 MHz, ACMOS OUTPUT
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