參數(shù)資料
型號: 2128E
廠商: Lattice Semiconductor Corporation
英文描述: In-System Programmable SuperFAST⑩ High Density PLD
中文描述: 在系統(tǒng)可編程超快⑩高密度可編程邏輯器件
文件頁數(shù): 4/11頁
文件大小: 142K
代理商: 2128E
Specifications
ispLSI 2128E
4
Switching Test Conditions
Figure 2. Test Load
TEST CONDITION
R1
470
470
R2
390
390
390
CL
35pF
35pF
35pF
A
B
Active High
Active Low
Active High to Z
at
V
OH
C
470
390
5pF
390
5pF
Active Low to Z
at
V
+0.5V
OL
Table 2 - 0004A/2000
Output Load Conditions (see Figure 2)
Input Pulse Levels
Table 2-0003/2128E
Input Rise and Fall Time 10% to 90%
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
1.5 ns
1.5V
1.5V
See Figure 2
3-state levels are measured 0.5V from
steady-state active level.
V
OL
V
OH
I
IL
SYMBOL
1. One output at a time for a maximum duration of one second. V
OUT
= 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
2. Meaured using eight 16-bit counters.
3. Typical values are at V
CC
= 5V and T
A
= 25
°
C.
4. Unused inputs held at 0.0V.
5. Maximum I
CC
varies widely with specific device configuration and operating frequency. Refer to the
Power Consumption section of this data sheet and the Thermal Management section of the Lattice Semiconductor
Data Book or CD-ROM to estimate maximum I
CC
.
Table 2-0007/2128E
I
IH
PARAMETER
I
IL-PU
I
OS
1
I
CC
3,4
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Operating Power Supply Current
I
OL
= 8 mA
I
OH
= -4 mA
0V
V
IN
V
IL
(Max.)
(V
CCIO
- 0.2)V
V
IN
V
CCIO
V
IL
= 0.0V, V
IH
= 3.0V
f
TOGGLE
= 1 MHz
CONDITION
MIN.
2.4
TYP.
3
MAX.
0.4
-10
UNITS
V
V
μ
A
10
10
μ
A
μ
A
μ
A
mA
mA
Input or I/O High Leakage Current
V
CCIO
V
IN
5.25V
0V
V
IN
2.0V
V
CCIO
= 5.0V or 3.3V, V
OUT
= 0.5V
I/O Active Pull-Up Current
Output Short Circuit Current
-10
-250
-240
165
+ 5V
R1
R2
CL
*
Device
Output
Test
Point
*
CL includes Test Fixture and Probe Capacitance.
0213A
DC Electrical Characteristics
Over Recommended Operating Conditions
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