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參數(shù)資料
| 型號(hào)： | 222-29401-A-R |
| 廠商： | COLE INSTRUMENT CORP |
| 元件分類： | 開(kāi)關(guān) |
| 英文描述： | ROTARY SWITCH-40POSITIONS, DP40T, LATCHED, 5A, 28VDC, PANEL MOUNT |
| 文件頁(yè)數(shù)： | 6/8頁(yè) |
| 文件大?。?/td> | 853K |
| 代理商： | 222-29401-A-R |
OPEN FRAME SERIES
Open Frame Instrument Switches
2650 South Croddy Way P.O. Box 25063 Santa Ana, California
92799-5063 USA
PHONE 714.556.3100
SALES FAX 714.241.9061
www.cole-switches.com
ISO9001 CERTIFIED
SIMULTANEOUS PARALLELING SWITCH
*Where it is required to have no open circulating between positions, including the independent
contact when the switch is rotated, use these SHORTING Basic I.D. numbers.
FUNCTION: The typical schematic left, is 24 positions, 15 degrees, 23 of the positions are
shorted together by 23 finger brushes connected in common to one collector ring. The 24th posi-
tion is contacted by an entirely separate finger brush which is connected to a separate collector
ring. As the switch is rotated, the separate brush makes contact with each switch position while
simultaneously all other
positions are shorted together. No second one pole deck is required to perform this function,
thus overall length is reduced and wiring time costs are reduced.
ONE PIECE FINGER BRUSHES: No mechanically or solder joined sections in the solid, stress-
free
one piece finger brush assembly. Solid fine silver finger brush contacts, stator contacts and col-
lector rings.
BINARY CODING OR POSITION SELECTION: Paralleling decks singly or in tandem are used
for binary coding or position selection allowing minimum amount of interconnecting circuit and
remote
control.
APPLICATION EXAMPLES:
1) Low voltage signal testing.
2) Multiple circuit cable testing, both continuity and voltage breakdown.
3) Current testing circuits to ground or common.
4) Solid state testing where it is desirable to connect all circuits to eliminate transients causing
erroneous test data.
5) One or more paralleling decks can be included in a standard multi-deck switch to meet all
types of requirements.
SIMULTANEOUS
PARALLELING
Open Frame Series/Page 6
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