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參數(shù)資料
| 型號： | 2377 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | IEEE 802.3af PoE POWERED DEVICE CONTROLLERS WITH AUTO-RETRY |
| 中文描述： | IEEE 802.3af標準的PoE用電設備控制器，自動重試 |
| 文件頁數(shù)： | 2/23頁 |
| 文件大?。?/td> | 649K |
| 代理商： | 2377 |
www.ti.com
AVAILABLE OPTIONS
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
, voltages are referenced to V
(VSS)
DISSIPATION RATING TABLE
(1)
TPS2375-1
TPS2377-1
SLVS570–MARCH 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
UVLO THRESHOLDS (NOMINAL)
TYPE
802.3af
30.5 V
Legacy
30.5 V
PACKAGE
(1)
T
A
MARKING
LOW
HIGH
39.3 V
35.1 V
SO-8
--
TSSOP-8
TPS2375PW-1
--
2375-1
2377-1
-40
°
C to 85
°
C
TPS2377D-1
(1)
Add an R suffix to the device type for tape and reel.
TPS237x
-0.3 V to 100 V
-0.3 V to 10 V
-0.3 V to 12 V
0 to 515 mA
0 to 5 mA
0 to 1 mA
0 to 50 mA
0 to 1 mA
2 kV
500 V
8/15 kV
Internally limited
-65
°
C to 150
°
C
260
°
C
235
°
C
VDD, RTN, DET, PG
(2)
ILIM, UVLO
CLASS
RTN
(3)
PG
DET
CLASS
ILIM
Human body model
Charged device model
System level (contact/air) at RJ-45
(4)
Voltage
Current, sinking
Current, sourcing
ESD
T
J
T
stg
Maximum junction temperature range
Storage temperature range
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds - Green Packages
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds - Nongreen
Packages
(1)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
I
= 0
SOA limited to V
= 80 V and I
= 515 mA.
Surges applied to RJ-45 of Figure 1 between pins of RJ-45, and between pins and output voltage rails per EN61000-4-2, 1999.
(2)
(3)
(4)
POWER RATING
T
A
= 85
°
C (HIGH-K)
(mW)
266
251
θ
JA
(LOW-K)
°
C/W
θ
JA
(HIGH-K)
°
C/W
PACKAGE
(2)
D (SO-8)
PW (TSSOP-8)
238
258.5
150
159
(1)
Tested per JEDEC JESD51. High-K is a (2 signal – 2 plane) test board and low-K is a double-sided
board with minimum pad area and natural convection.
For the most current package and ordering information, see the Package Option Addendum at the
end of this document, or see the TI Web site at
www.ti.com
.
(2)
2
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