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參數(shù)資料
| 型號： | 24WC32 |
| 元件分類： | EEPROM |
| 英文描述： | 64K 8K x 8 Battery-Voltage CMOS E2PROM |
| 中文描述： | 64K的8K的× 8電池電壓的CMOS E2PROM的 |
| 文件頁數(shù)： | 2/8頁 |
| 文件大小： | 74K |
| 代理商： | 24WC32 |
Preliminary
CAT24WC32/64
2
Doc. No. 25053-00 2/98 S-1
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55
°
C to +125
°
C
Storage Temperature....................... –65
°
C to +150
°
C
Voltage on Any Pin with
Respect to Ground
(1)
........... –2.0V to +V
CC
+ 2.0V
V
CC
with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25
°
C)................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°
C
Output Short Circuit Current
(2)
........................ 100mA
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
RELIABILITY CHARACTERISTICS
Symbol
N
END(3)
Endurance
T
DR(3)
Data Retention
V
ZAP(3)
ESD Susceptibility
I
LTH(3)(4)
Latch-up
Parameter
Min.
Max.
Units
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
1,000,000
100
2000
100
Cycles/Byte
Years
Volts
mA
Limits
Symbol Parameter
Min.
Typ.
Max.
Units Test Conditions
I
CC
I
SB(5)
I
LI
I
LO
V
IL
V
IH
V
OL1
V
OL2
Power Supply Current
3
mA
f
SCL
= 100 KHz
V
IN
= GND or V
CC
V
IN
= GND to V
CC
V
OUT
= GND to V
CC
Standby Current (V
CC
= 5V)
Input Leakage Current
0
μ
A
μ
A
μ
A
10
Output Leakage Current
10
Input Low Voltage
–1
V
CC
x 0.3
V
CC
+ 0.5
0.4
V
Input High Voltage
V
CC
x 0.7
V
Output Low Voltage (V
CC
= +3.0V)
Output Low Voltage (V
CC
= +1.8V)
V
I
OL
= 3.0 mA
I
OL
= 1.5 mA
0.5
V
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +6.0V, unless otherwise specified.
CAPACITANCE
T
A
= 25
°
C, f = 1.0 MHz, V
CC
= 5V
Symbol
Test
Max.
Units
Conditions
C
I/O(3)
C
IN(3)
Input/Output Capacitance (SDA)
8
pF
V
I/O
= 0V
Input Capacitance (A0, A1, A2, SCL, WP)
6
pF
V
IN
= 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+ 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
CC
+1V.
(5) Standby current (I
SB
) = 0
μ
A (<900 nA).
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