參數(shù)資料
型號(hào): 28C17A
廠商: Microchip Technology Inc.
元件分類: EEPROM
英文描述: The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each
中文描述: 該CAT24FC02是一個(gè)2 KB的EEPROM的國(guó)內(nèi)256個(gè)8位每字舉辦的串行CMOS
文件頁數(shù): 3/8頁
文件大小: 67K
代理商: 28C17A
1996 Microchip Technology Inc.
DS11127G-page 3
28C17A
TABLE 1-3:
READ OPERATION AC CHARACTERISTICS
FIGURE 1-1:
READ WAVEFORMS
AC Testing Waveform:
Output Load:
Input Rise and Fall Times:
Ambient Temperature:
V
1 TTL Load + 100 pF
20 ns
Commercial (C):
Industrial (I):
IH
= 2.4V; V
IL
= 0.45V; V
OH
= 2.0V; V
OL
= 0.8V
Tamb
Tamb
=
=
0C to +70C
-40C to +85C
Parameter
Symbol
28C17A
-15
28C17A
-20
28C17A
-25
Units
Conditions
Min
Max
Min
Max
Min
Max
Address to Output Delay
t
ACC
150
200
250
ns
OE = CE = V
IL
CE to Output Delay
t
CE
150
200
250
ns
OE = V
IL
OE to Output Delay
t
OE
70
80
100
ns
CE = V
IL
CE or OE High to Output
Float
t
OFF
0
50
0
55
0
70
ns
Output Hold from Address,
CE or OE, whichever occurs
first.
t
OH
0
0
0
ns
Endurance
1M
1M
1M
cycles
25
5.0V, Block
Mode (Note)
°
C, Vcc =
Note: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific appli-
cation, please consult the Total Endurance Model which can be obtained on our BBS or website.
Address
CE
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
OE
Data
WE
V
OH
V
OL
V
IH
V
OL
Address Valid
High Z
Valid Output
t
ACC
(1) t
OFF
is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to t
CE
- t
OE
after the falling edge of CE without impact on t
CE
(3) This parameter is sampled and is not 100% tested
High Z
t
OH
t
OFF(1,3)
Notes:
t
OE(2)
t
CE(2)
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