參數(shù)資料
型號(hào): 29F002B-90
廠商: Macronix International Co., Ltd.
英文描述: 2M-BIT [256K x 8] CMOS FLASH MEMORY
中文描述: 200萬位[256K × 8]的CMOS閃存
文件頁數(shù): 7/51頁
文件大小: 622K
代理商: 29F002B-90
7
REV. 1.5, MAR. 28, 2005
P/N: PM0547
MX29F002/002N T/B
READ/RESET COMMAND
The read or reset operation is initiated by writing the read/
reset command sequence into the command register.
Microprocessor read cycles retrieve array data. The
device remains enabled for reads until the command
register contents are altered.
If program-fail or erase-fail happen, the write of F0H will
reset the device to abort the operation. A valid command
must then be written to place the device in the desired
state.
SILICON-ID-READ COMMAND
Flash memories are intended for use in applications where
the local CPU alters memory contents. As such,
manufacturer and device codes must be accessible while
the device resides n the target system. PROM programmers
typically access signature codes by raising A9 to a high
voltage. However, multiplexing high voltage onto address
lines is not generally desired system design practice.
The MX29F002T/B contains a Silicon-ID-Read operation
to supplement traditional PROM programming methodology.
The operation is initiated by writing the read silicon ID
command sequence into the command register. Following
the command write, a read cycle with A1=VIL, A0=VIL
retrieves the manufacturer code of C2H. A read cycle with
A1=VIL, A0=VIH returns the device code of B0h for
MX29F002T, 34h for MX29F002B.
Pins
A0
A1
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
Code(Hex)
Code
Manufacture code
Device code
for MX29F002T
Device code
for MX29F002B
Sector Protection
Verification
VIL
VIH
VIL
VIL
1
1
1
0
0
1
0
1
0
0
0
0
1
0
0
0
C2H
B0h
VIH
VIL
0
0
1
1
0
1
0
0
34h
X
X
VIH
VIH
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
01H (Protected)
00H (Unprotected)
TABLE 3. EXPANDED SILICON ID CODE
SET-UP AUTOMATIC CHIP/SECTOR ERASE
COMMANDS
Chip erase is a six-bus cycle operation. There are two
"unlock" write cycles. These are followed by writing the
"set-up" command 80H. Two more "unlock" write cycles
are then followed by the chip erase command 10H.
The Automatic Chip Erase does not require the device to
be entirely pre-programmed prior to executing the Automatic
Chip Erase. Upon executing the Automatic Chip Erase,
the device will automatically program and verify the entire
memory for an all-zero data pattern. When the device is
automatically verified to contain an all-zero pattern, a self-
timed chip erase and verify begin. The erase and verify
operations are completed when the data on Q7 is "1" at
which time the device returns to the Read mode. The
system is not required to provide any control or timing
during these operations.
When using the Automatic Chip Erase algorithm, note that
the erase automatically terminates when adequate erase
margin has been achieved for the memory array(no erase
verify command is required).
If the Erase operation was unsuccessful, the data on Q5
is "1" (see Table 4), indicating the erase operation exceed
internal timing limit.
The automatic erase begins on the rising edge of the last
WE pulse in the command sequence and terminates when
the data on Q7 is "1" and the data on Q6 stops toggling for
two consecutive read cycles, at which time the device
returns to the Read mode.
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