參數(shù)資料
型號(hào): 2MBI1200UG-170
廠商: Electronic Theatre Controls, Inc.
英文描述: IGBT MODULE
中文描述: IGBT模塊
文件頁數(shù): 6/13頁
文件大?。?/td> 475K
代理商: 2MBI1200UG-170
H04-004-03a
MS5F5932
13
11. Reliability test results
6
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Test Method 401
Method
Test Method 402
method
Number
of
sample
Accept-
ance
number
1 Terminal Strength
(Pull test)
2 Mounting Strength
Pull force
Test time
Screw torque
: 40N
: 10±1 sec.
: 1.8 ~ 2.1 N
m (M4)
4.25 ~ 5.75 N
m (M6)
8 ~ 10 N
m (M8)
: 10±1 sec.
5
( 0 : 1 )
5
( 0 : 1 )
Test time
Range of frequency : 10 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Z axis
Test time
Maximum acceleration : 1000m/s
2
Pulse width
Direction
Test time
Storage temp.
Test duration
Storage temp.
Test duration
Storage temp.
Relative humidity
Test duration
Test temp.
Test humidity
Test duration
3 Vibration
Test Method 403
Reference 1
Condition code B
5
( 0 : 1 )
: 15 min.
: 100m/s
2
: 6 hr. (2hr./direction)
4 Shock
Test Method 404
Condition code A
5
( 0 : 1 )
: 6.0msec.
: Each X,Y,Z axis
: 3 times/direction
: 125±5
: 1000hr.
: -40±5
: 1000hr.
: 85±2
: 85±5%
: 1000hr.
: 120
±
2
: 85±5%
: 96hr.
1 High Temperature
Storage
2 Low Temperature
Storage
3 Temperature
Humidity
Storage
4 Unsaturated
Pressurized Vapor
Test Method 201
5
( 0 : 1 )
Test Method 202
5
( 0 : 1 )
Test Method 103
Test code C
5
( 0 : 1 )
Test Method 103
Test code E
5
( 0 : 1 )
5 Temperature
Cycle
Test Method 105
5
( 0 : 1 )
Test temp.
: Low temp. -40
±
5
High temp. 125
±
5
RT 5 ~ 35
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
: 100 cycles
+0
: High temp. 100
-5
+5
Low temp. 0
-0
Dwell time
Number of cycles
6 Thermal Shock
Test Method 307
method
Condition code A
5
( 0 : 1 )
Test temp.
Used liquid : Water with ice and boiling water
Dipping time
Transfer time
Number of cycles
: 5 min. par each temp.
: 10 sec.
: 10 cycles
M
E
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