參數(shù)資料
型號： 2MBI300TA-060
廠商： FUJI ELECTRIC CO LTD
元件分類： IGBT 晶體管
英文描述： IGBT Module
中文描述： 300 A, 600 V, N-CHANNEL IGBT
封裝： MODULE-7
文件頁數(shù)： 8/14頁
文件大?。?/td> 612K
代理商： 2MBI300TA-060
H04-004-03
14
MS5F 5292
a
8
Failure Criteria
Item
Characteristic
Symbol
Failure criteria
Lower limit
-
-
LSL×0.8
-
-
-
Unit
Note
Upper limit
USL×2
USL×2
USL×1.2
USL×1.2
USL×1.2
USL×1.2
Electrical
characteristic
Leakage current
ICES
±IGES
VGE(th)
VCE(sat)
VF
'
VGE
or
'
VCE
'
VF
Viso
mA
P
A
mA
V
V
mV
Gate threshold voltage
Saturation voltage
Forward voltage
Thermal
resistance
IGBT
FWD
-
USL×1.2
mV
-
Isolation voltage
Visual inspection
Peeling
Plating
and the others
Broken insulation
Visual
inspection
-
The visual sample
-
LSL : Lower specified limit.
USL : Upper specified limit.
Note : Each parameter measurement read-outs shall be made after stabilizing the components at room
ambient for 2 hours minimum, 24 hours maximum after removal from the tests. And in case of the
wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry
completely before the measurement.
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ
ED-4701
D - 313
Number
of sample
Accept-
ance
number
1 High temperature
Reverse Bias
+0
: Ta = 125
-5
℃
(Tj
≦
150
℃
)
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
+0
: Ta = 125
-5
℃
(Tj
≦
150
℃
)
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
VCE = 0V
: 1000hr.
5
( 1 : 0 )
Test temp.
Bias Voltage
Bias Method
Test duration
2 High temperature
Bias
D - 323
5
( 1 : 0 )
Test temp.
Bias Voltage
Bias Method
Test duration
3 Temperature
Humidity Bias
B - 121
5
( 1 : 0 )
Test temp.
Relative humidity
Bias Voltage
Bias Method
: 85 +-3
o
C
: 85 +-5%
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
: 2 sec.
: 18 sec.
:
'
Tj=100±5 deg
Tj
≦
150
℃
, Ta=25±5
℃
: 15000 cycles
Test duration
ON time
OFF time
Test temp.
4 Intermitted
Operating Life
(Power cycle)
( for IGBT )
D - 322
5
( 1 : 0 )
Number of cycles
E
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參數(shù)描述
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