參數(shù)資料
型號: 2MBI300U4H-170
廠商: FUJI ELECTRIC CO LTD
元件分類: IGBT 晶體管
英文描述: IGBT MODULE
中文描述: 400 A, 1700 V, N-CHANNEL IGBT
封裝: MODULE-7
文件頁數(shù): 7/13頁
文件大?。?/td> 219K
代理商: 2MBI300U4H-170
*C
MS5F6137
13
7
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of
sample
Accept-
ance
number
1 High temperature
Reverse Bias
Test Method 101
5
( 0 : 1 )
Test temp.
: Ta = 125
5
(Tj
150
)
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
Bias Voltage
Bias Method
Test duration
2 High temperature
Bias (for gate)
Test Method 101
5
( 0 : 1 )
Test temp.
: Ta = 125
5
(Tj
150
)
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
VCE = 0V
: 1000hr.
Bias Voltage
Bias Method
Test duration
3 Temperature
Humidity Bias
Test Method 102
Condition code C
5
( 0 : 1 )
Test temp.
Relative humidity
Bias Voltage
Bias Method
: 85
2
o
C
: 85
5%
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
: 2 sec.
: 18 sec.
:
'
Tj=100±5 deg
Tj
150
, Ta=25±5
: 15000 cycles
Test duration
ON time
OFF time
Test temp.
4 Intermitted
Operating Life
(Power cycle)
( for IGBT )
Test Method 106
5
( 0 : 1 )
Number of cycles
E
E
Failure Criteria
Item
Characteristic
Symbol
Failure criteria
Lower limit Upper limit
Unit
Note
Electrical
characteristic
Leakage current
ICES
±IGES
-
-
USL×2
USL×2
mA
P
A
Gate threshold voltage VGE(th)
LSL×0.8
USL×1.2
mA
Saturation voltage
VCE(sat)
-
USL×1.2
V
Forward voltage
Thermal
VF
-
-
USL×1.2
USL×1.2
V
IGBT
'
VGE
or
'
VCE
'
VF
mV
resistance
FWD
-
USL×1.2
mV
Isolation voltage
Viso
Broken insulation
-
Visual
Visual inspection
inspection
Peeling
-
The visual sample
-
Plating
and the others
LSL : Lower specified limit.
USL : Upper specified limit.
Note : Each parameter measurement read-outs shall be made after stabilizing the components
shall be made wipe or dry completely before the measurement.
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
And in case of the wetting tests, for example, moisture resistance tests, each component
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