參數(shù)資料
型號: 2MBI400TB-060
廠商: FUJI ELECTRIC CO LTD
元件分類: IGBT 晶體管
英文描述: IGBT Module
中文描述: 400 A, 600 V, N-CHANNEL IGBT
封裝: MODULE-4
文件頁數(shù): 7/14頁
文件大?。?/td> 608K
代理商: 2MBI400TB-060
H04-004-03
14
MS5F 5293
c
a
b
13. Reliability test results
7
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ
ED-4701
A - 111
Method 1
A - 112
Number
of sample
Accept-
ance
number
1 Terminal Strength
(Pull test)
2 Mounting Strength
Pull force
Test time
Screw torque
:
: 10±1 sec.
: 2.5 ~ 3.5 N
m (M5)
a
40N
5
( 1 : 0 )
5
( 1 : 0 )
Test time
Range of frequency : 10 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Z axis
Test time
Maximum acceleration : 1000G
Pulse width
Direction
Test time
Storage temp.
Test duration
Storage temp.
Test duration
Storage temp.
Relative humidity
Test duration
Test temp.
Atmospheric pressure : 2.03×10
5
Pa
: 10±1 sec.
Method 2
A - 121
3 Vibration
5
( 1 : 0 )
: 15 min.
:
a
10G
: 6 hr. (2hr./direction)
4 Shock
A - 122
5
( 1 : 0 )
: 0.5msec.
: Each X,Y,Z axis
: 3 times/direction
: 125±5
: 1000hr.
: -40±5
: 1000hr.
: 85±3
: 85±5%
: 1000hr.
: 121
1 High Temperature
Storage
2 Low Temperature
Storage
3 Temperature
Humidity
Storage
4 Unsaturated
Pressure Cooker
B - 111
5
( 1 : 0 )
B - 112
5
( 1 : 0 )
B - 121
5
( 1 : 0 )
B - 123
5
( 1 : 0 )
(Reference value)
: 20hr.
+3
: Low temp. -40
-5
+5
High temp. 125
-5
Test duration
5 Temperature
Cycle
B - 131
5
( 1 : 0 )
Test temp.
RT 5 ~ 35
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
: 100 cycles
+0
: High temp. 100
-5
+5
Low temp. 0
-0
Dwell time
Number of cycles
6 Thermal Shock
B - 141
5
( 1 : 0 )
Test temp.
Used liquid : Water with ice and
a
boiling water
Dipping time
Transfer time
Number of cycles
: 5 min. par each temp.
: 10 sec.
: 10 cycles
M
E
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