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參數(shù)資料
| 型號： | 5962-0620601VZA |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 運(yùn)算放大器 |
| 英文描述： | DUAL OP-AMP, 60 uV OFFSET-MAX, 3 MHz BAND WIDTH, CDSO10 |
| 封裝： | CERAMIC, SOIC-10 |
| 文件頁數(shù)： | 2/14頁 |
| 文件大?。?/td> | 365K |
| 代理商： | 5962-0620601VZA |
LMP2012 AS ADC INPUT AMPLIFIER
The LMP2012 is a great choice for an amplifier stage imme-
diately before the input of an ADC (Analog-to-Digital Con-
8. This is because of the following important characteristics:
A) Very low offset voltage and offset voltage drift over time
and temperature allow a high closed-loop gain setting
without introducing any short-term or long-term errors.
For example, when set to a closed-loop gain of 100 as the
analog input amplifier for a 12-bit A/D converter, the over-
all conversion error over full operation temperature and
30 years life of the part (operating at 50°C) would be less
than 5 LSBs.
B) Fast large-signal settling time to 0.01% of final value (1.4
μs) allows 12 bit accuracy at 100 KH
Z or more sampling
rate.
C) No flicker (1/f) noise means unsurpassed data accuracy
over any measurement period of time, no matter how
long. Consider the following op amp performance, based
on a typical low-noise, high-performance commercially-
available device, for comparison:
Op amp flatband noise = 8nV/
1/f corner frequency = 100 Hz
A
V = 2000
Measurement time = 100 sec
Bandwidth = 2 Hz
This example will result in about 2.2 mV
PP (1.9 LSB) of
output noise contribution due to the op amp alone, com-
pared to about 594
μV
PP (less than 0.5 LSB) when that
op amp is replaced with the LMP2012 which has no 1/f
contribution. If the measurement time is increased from
100 seconds to 1 hour, the improvement realized by using
the LMP2012 would be a factor of about 4.8 times (2.86
mV
PP compared to 596 μV when LMP2012 is used) main-
ly because the LMP2012 accuracy is not compromised
by increasing the observation time.
D) Rail-to-Rail output swing maximizes the ADC dynamic
range in 5-Volt single-supply converter applications. Be-
low are some typical block diagrams showing the
20182222
FIGURE 8.
RADIATION ENVIRONMENTS
Careful consideration should be given to environmental con-
ditions when using a product in a radiation environment.
TOTAL IONIZING DOSE
Radiation hardness assured (RHA) products are those part
numbers with a total ionizing dose (TID) level specified in the
Ordering Information table on the front page. Testing and
qualification of these products is done on a wafer level ac-
cording to MIL-STD-883G, Test Method 1019.7, Condition A
and the “Extended room temperature anneal test” described
in section 3.11 for application environment dose rates less
than 0.082 rad(Si)/s. Wafer level TID data are available with
lot shipments.
ELDRS-FREE PRODUCTS
ELDRS-Free products are tested and qualified on a wafer
level basis at a dose rate of 10 mrad(Si)/s per MIL-STD-883G,
Test Method 1019.7, Condition D. Wafer level low dose rate
test data are available with lot shipments.
SINGLE EVENT UPSET
A report on single event upset (SEU) is available upon re-
quest.
www.national.com
10
LMP2012QML
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
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| 5962-0620701Q3A | 制造商:Intersil Corporation 功能描述:LINE TRANSMITTER/RCVR 3TR 3TX 5RX 28CLCC - Rail/Tube |
| 5962-0620702Q3A | 制造商:Intersil Corporation 功能描述:LINE TRANSMITTER/RCVR 3TR 5TX 3RX 28CLCC - Rail/Tube |
| 5962-0620703Q2A | 制造商:Intersil Corporation 功能描述:LINE TRANSMITTER/RCVR 1TR 1TX 1RX 20CLCC - Rail/Tube |
| 5962-0620704Q2A | 制造商:Intersil Corporation 功能描述:LINE TRANSMITTER/RCVR 2TR 2TX 2RX 20CLCC - Rail/Tube |
| 5962-0620705Q3A | 制造商:Intersil Corporation 功能描述:LINE TRANSMITTER/RCVR 3TR 3TX 5RX 28CLCC - Rail/Tube |
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