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參數(shù)資料
| 型號： | 5962-9169003MXX |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | ADC |
| 英文描述： | 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CDIP28 |
| 封裝： | CERAMIC, DIP-28 |
| 文件頁數(shù)： | 11/22頁 |
| 文件大?。?/td> | 294K |
| 代理商： | 5962-9169003MXX |
STANDARDIZED
MICROCIRCUIT DRAWING
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
SIZE
A
5962-91690
REVISION LEVEL
B
SHEET
17
DESC FORM 193A
JUL 94
TABLE II. Electrical test requirements.
Test requirements
Subgroups
(in accordance with
MIL-STD-883, TM
5005, table I)
Subgroups
(in accordance with
MIL-I-38535, table III)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
11
1
Final electrical
parameters (see 4.2)
1,2,3, 1/
1,2,3 1/
1,2,3, 2/
Group A test
requirements (see 4.4)
1,2,3,7
8,9,10,11 2/
1,2,3,7,
8,9,10,11 2/
1,2,3,7,
8,9,10,11 2/
Group C end-point electrical
parameters (see 4.4)
11
1
Group D end-point electrical
parameters (see 4.4)
11
1
1/ PDA applies to subgroup 1.
2/ PDA applies to subgroups 1 and 7.
4.4.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes
Q and V, subgroups 7 and 8 shall include verifying the functionality of the device; these tests shall have
been fault graded in accordance with MIL-STD-883, test method 5012 (see 1.5 herein).
c.
Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2
Group C inspection. The group C inspection end-point electrical parameters shallbe as specified in table II herein.
4.4.2.1 Additional criteria for device classes M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1005.
b.
T = +125
C, minimum.
A
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-I-38535. The test
circuit shall be maintained under document revision level control by the device manufacturer's TRB, in accordance with MIL-I-
38535, and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005.
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