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| 型號： | 5962P0052401VPA |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 比較器 |
| 英文描述： | COMPARATOR, 4000 uV OFFSET-MAX, 200 ns RESPONSE TIME, CDIP8 |
| 封裝： | CERDIP-8 |
| 文件頁數(shù)： | 17/18頁 |
| 文件大?。?/td> | 417K |
| 代理商： | 5962P0052401VPA |
MRLM111-X-RH REV 0E1
MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC PARAMETERS: DRIFT VALUES
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC:
+Vcc = +15V, Vcm = 0V.
"Delta calculations performed on JAN S and QMLV devices at group B, subgroup 5
only".
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
Vio
Input Offset
Voltage
Vin = 0V, Rs = 50 Ohms
-0.5
0.5
mV
1
+Vcc = 29.5V, -Vcc = -0.5V, Vin = 0V,
Vcm = -14.5V, Rs = 50 Ohms
-0.5
0.5
mV
1
+Vcc = 2V, -Vcc = -28V, Vin = 0V,
Vcm = +13V, Rs = 50 Ohms
-0.5
0.5
mV
1
Iib+
Input Bias
Current
Vin = 0V, Rs = 50K Ohms
-12.5
12.5
nA
1
+Vcc = 29.5V, -Vcc = -0.5V, Vin = 0V,
Vcm = -14.5V, Rs = 50K Ohms
-12.5
12.5
nA
1
+Vcc = 2V, -Vcc = -28V, Vin = 0V,
Vcm = +13V, Rs = 50K Ohms
-12.5
12.5
nA
1
Iib-
Input Bias
Current
Vin = 0V, Rs = 50K Ohms
-12.5
12.5
nA
1
+Vcc = 29.5V, -Vcc = -0.5V, Vin = 0V,
Vcm
= -14.5V, Rs = 50K Ohms
-12.5
12.5
nA
1
+Vcc = 2V, -Vcc = -28V, Vin = 0V,
Vcm
= +13V, Rs = 50K Ohms
-12.5
12.5
nA
1
Icex
Output Leakage
Current
+Vcc = 18V, -Vcc = -18V, Vout = 32V
-5
5
nA
1
Note 1:
Istb = -2mA at -55 C.
Note 2:
Calculated parameter.
Note 3:
Use DC tape for Ios and Vio(adj), Ave+ and Ave- as indicated in TAPE NAME section of
this JRETS.
Note 4:
Uses AC tape and hardware.
Note 5:
Actual min. limit used is 5mA due to test setup.
Note 6:
Datalog reading in K = V/mV.
Note 7:
Vid is voltage difference between inputs.
Note 8:
Pre and post irradiation limits are identical to those listed under AC and DC
electrical characteristics except as listed in the Post Radiation Limits Table. These
parts may be dose rate sensitive in a space environment and demonstrate enhanced low
dose rate effect. Radiaton end point limits for the noted parameters are guaranteed
only for the conditions as specified in MIL-STD-883, Method 1019.5, Condition A.
8
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