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參數(shù)資料
| 型號(hào)： | 5962R0822301KXC |
| 廠商： | CRANE ELECTRONICS INC |
| 元件分類： | 電源模塊 |
| 英文描述： | 1-OUTPUT 100 W DC-DC REG PWR SUPPLY MODULE |
| 封裝： | HERMETIC SEALED PACKAGE-12 |
| 文件頁(yè)數(shù)： | 5/14頁(yè) |
| 文件大?。?/td> | 614K |
| 代理商： | 5962R0822301KXC |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)當(dāng)前第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)
Screening table 1: element eValuatiOn
Screening table 1: element eValuatiOn - SPace cOnVerterS anD FilterS
CLaSS H anD K, MiL-prF-38534 eLeMent eVaLuatiOn
COMpOnent-LeVeL teSt perFOrMeD
SpaCe
prOtOtype (O) 1
nOn
-QML
/H
CLaSS H
QML
/K
CLaSS K
QML
M/S 2
p 3
M/S 2
p 3
Element Electrical
Visual
Internal Visual
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
WireBondEvaluation
SEM
C-SAM: Input capacitors only
Add’l test, not req. by H or K
Notes:
1. Non-QML products may not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components, Class H and K element evaluation. Not applicable to Space Prototype (“O”) element evaluation.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
Crane Aerospace & Electronics Power Solutions
www.craneae.com/interpoint
Page 13 of 14
smFlHp single and dual dc/dc converters
28 Volt input – 100 Watt
Rev J - 2011.05.04
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