參數(shù)資料
型號： 74ABT16245CSSC
廠商： FAIRCHILD SEMICONDUCTOR CORP
元件分類： 通用總線功能
英文描述： 16-Bit Transceiver with 3-STATE Outputs
中文描述： ABT SERIES, DUAL 8-BIT TRANSCEIVER, TRUE OUTPUT, PDSO48
封裝： 0.300 INCH, MO-118, SSOP-48
文件頁數(shù)： 3/8頁
文件大?。?/td> 102K
代理商： 74ABT16245CSSC
3
www.fairchildsemi.com
7
Absolute Maximum Ratings
(Note 1)
Recommended Operating
Conditions
Note 1:
Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3:
Guaranteed, but not tested.
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
V
CC
Pin Potential to Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Any Output
in the Disabled or
Power-Off State
in the HIGH State
Current Applied to Output
in LOW State (Max)
DC Latchup Source Current
Over Voltage Latchup (I/O)
65
q
C to 150
q
C
55
q
C to 125
q
C
55
q
C to 150
q
C
0.5V to 7.0V
0.5V to 7.0V
30 mA to 5.0 mA
0.5V to 5.5V
0.5V to V
CC
twice the rated I
OL
(mA)
500 mA
10V
Free Air Ambient Temperature
Supply Voltage
Minimum Input Edge Rate (
'
V/
'
t)
Data Input
Enable Input
40
q
C to 85
q
C
4.5V to 5.5V
50 mV/ns
20 mV/ns
Symbol
Parameter
Min
Typ
Max
Units
V
CC
Conditions
V
IH
V
IL
Input HIGH Voltage
2.0
V
Recognized HIGH Signal
Input LOW Voltage
0.8
V
Recognized LOW Signal
V
CD
V
OH
Input Clamp Diode Voltage
Output HIGH Voltage
1.2
V
V
V
Min
Min
Min
I
IN
18 mA (OE
n
, T/R
n
)
I
OH
3 mA (A
n
, B
n
)
I
OH
32 mA (A
n
, B
n
)
I
OL
64 mA (A
n
, B
n
)
2.5
2.0
V
OL
Output LOW Voltage
0.55
V
Min
I
IH
Input HIGH Current
1
1
P
A
Max
V
IN
2.7V (OE
n
, T/R
n
) (Note 3)
V
IN
V
CC
(OE
n
, T/R
n
)
I
BVI
I
BVIT
Input HIGH Current Breakdown Test
7
P
A
Max
V
IN
7.0V (OE
n
, T/R
n
)
V
IN
5.5V (A
n
, B
n
)
Input HIGH Current Breakdown Test (I/O)
100
P
A
Max
I
IL
Input LOW Current
1
1
P
A
Max
V
IN
0.5V (OE
n
, T/R
n
) (Note 3)
V
IN
0.0V (OE
n
, T/R
n
)
V
ID
Input Leakage Test
4.75
V
0.0
I
ID
1.9
P
A (OE
n
, T/R
n
)
All Other Pins Grounded
I
IH
I
OZH
Output Leakage Current
10
P
A
0 5.5V
V
OUT
2.7V (A
n
, B
n
); OE
2.0V
I
IL
I
OZL
I
OS
I
CEX
I
ZZ
Output Leakage Current
10
P
A
0 5.5V
V
OUT
0.5V (A
n
, B
n
); OE
2.0V
V
OUT
0.0V (A
n
, B
n
)
V
OUT
V
CC
(A
n
, B
n
)
V
OUT
5.50V (A
n
, B
n
);
All Others GND
All Outputs HIGH
All Outputs LOW
Output Short-Circuit Current
Output HIGH Leakage Current
Bus Drainage Test
100
275
50
100
mA
P
A
P
A
Max
Max
0.0
I
CCH
I
CCL
Power Supply Current
Power Supply Current
100
60
P
A
mA
Max
Max
I
CCZ
Power Supply Current
100
P
A
Max
OE
n
V
CC
, T/R
n
GND or V
CC
All others at V
CC
or GND
V
I
V
CC
2.1V
OE
n
, T/ R
n
V
I
V
CC
2.1V
Data Input V
I
V
CC
2.1V
All others at V
CC
or GND
Outputs OPEN
I
CCT
Additional I
CC
/Input
Outputs Enabled
Outputs 3-STATE
2.5
2.5
mA
mA
Max
Outputs 3-STATE
50
P
A
I
CCD
Dynamic I
CC
No Load
mA/
Max
(Note 3)
0.1
MHz
OE
n
GND, T/R
n
GND or V
CC
One Bit Toggling, 50% Duty Cycle
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