參數(shù)資料
型號(hào): 74ABT899
廠商: NXP Semiconductors N.V.
英文描述: 9-bit dual latch transceiver with 8-bit parity generator/checker 3-State
中文描述: 9位雙鎖存器的8位奇偶發(fā)生器/檢查三態(tài)
文件頁(yè)數(shù): 5/16頁(yè)
文件大小: 123K
代理商: 74ABT899
Philips Semiconductors
Product specification
74ABT899
9-bit dual latch transceiver with 8-bit parity
generator/checker (3-State)
1998 Jan 16
5
PARITY AND ERROR FUNCTION TABLE
INPUTS
OUTPUTS
SEL
ODD/EVEN
xPAR
(A or B)
Σ
of High
Inputs
xPAR
(B or A)
ERRt
ERRr*
PARITY MODES
H
H
H
Even
Odd
H
H
H
L
H
L
Odd
H
H
L
Even
Odd
L
L
L
H
L
H
Mode
Feed-through/check parity
H
L
H
Even
Odd
H
H
L
H
L
H
Even
H
L
L
Even
Odd
L
L
H
L
H
L
Mode
L
H
H
Even
Odd
H
L
H
L
H
H
Odd
L
H
L
Even
Odd
H
L
L
H
H
H
Mode
Generate parity
L
L
H
Even
Odd
L
H
L
H
H
H
Even
L
L
L
Even
Odd
L
H
H
L
H
H
Mode
H =
L
t
r
*
High voltage level
Low voltage level
Transmit–if the data path is from A
B then ERRt is ERRA
Receive–if the data path is from A
B then ERRr is ERRB
Blocked if latch is not transparent
=
=
=
ABSOLUTE MAXIMUM RATINGS
1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
DC supply voltage
–0.5 to +7.0
V
I
IK
DC input diode current
V
I
< 0
–18
mA
V
I
DC input voltage
3
–1.2 to +7.0
V
I
OK
DC output diode current
V
O
< 0
–50
mA
V
OUT
DC output voltage
3
output in Off or High state
–0.5 to +5.5
V
I
OUT
DC output current
output in Low state
128
mA
T
stg
Storage temperature range
–65 to 150
°
C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 1505C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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