參數(shù)資料
型號(hào): 74AUP1G885GD,125
廠商: NXP Semiconductors
文件頁(yè)數(shù): 4/23頁(yè)
文件大?。?/td> 0K
描述: IC GATE DUAL FUNCTION XSON8
特色產(chǎn)品: MicroPak?
標(biāo)準(zhǔn)包裝: 1
系列: 74AUP
邏輯類型: 可配置多功能
電路數(shù): 1
輸入數(shù): 3
施密特觸發(fā)器輸入:
輸出類型: 單端
輸出電流高,低: 4mA,4mA
電源電壓: 0.8 V ~ 3.6 V
工作溫度: -40°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 8-XFDFN
供應(yīng)商設(shè)備封裝: 8-XSON,SOT996-2 (2x3)
包裝: 標(biāo)準(zhǔn)包裝
其它名稱: 568-5394-6
74AUP1G885
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 9 — 31 January 2013
12 of 23
NXP Semiconductors
74AUP1G885
Low-power dual function gate
[1]
For measuring enable and disable times RL = 5 k.
For measuring propagation delays, set-up and hold times and pulse width RL = 1 M.
Test data is given in Table 10.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 7.
Test circuit for measuring switching times
001aac521
DUT
RT
VI
VO
VEXT
VCC
RL
5 k
Ω
CL
G
Table 10.
Test data
Supply voltage
Load
VEXT
VCC
CL
tPLH, tPHL
tPZH, tPHZ
tPZL, tPLZ
0.8 V to 3.6 V
5 pF, 10 pF, 15 pF and 30 pF
5 k
or 1 M
open
GND
2
V
CC
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74AUP1G885GF 制造商:NXP Semiconductors 功能描述:IC 3 INPUT DUAL-FUNC GATE XS
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74AUP1G885GM 制造商:NXP Semiconductors 功能描述:Multi Function Gate 2-Element 2-IN CMOS 8-Pin XQFN8U Bulk 制造商:NXP Semiconductors 功能描述:IC 3 INPUT DUAL-FUNC GATE XQ
74AUP1G885GM,125 功能描述:邏輯門 1.8V LOW-PWR RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量(輸入/輸出):2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時(shí)間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel
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