
Philips Semiconductors
Product specification
74F353
Dual 4-input multiplexer (3-State)
1996 Jan 05
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
–0.5 to +7.0
V
Input voltage
–0.5 to +7.0
V
Input current
–30 to +5
mA
Voltage applied to output in High output state
–0.5 to V
CC
48
V
Current applied to output in Low output state
mA
Operating free-air temperature range
0 to +70
°
C
°
C
Storage temperature
–65 to +150
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
NOM
UNIT
MIN
MAX
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
T
amb
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High-level output current
–3
mA
Low-level output current
24
mA
Operating free-air temperature range
0
70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High level output voltage
High-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN, I
OH
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.4
V
IL
,
2.7
3.3
V
V
OL
Low level output voltage
Low-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN, I
OL
= MAX
0.35
0.50
V
IL
,
0.35
0.50
V
V
IK
I
I
I
IH
I
IL
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
–0.73
–1.2
V
Input current at maximum input voltage
100
μ
A
μ
A
mA
High-level input current
20
Low-level input current
–0.6
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
OEn=Sn=In=GND
9
14
mA
I
CC
Supply current (total)
V
CC
= MAX
OEn=Sn=GND, In=4.5V
11
20
mA
OEn=4.5V, Sn=In=GND
13
23
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.