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參數(shù)資料
| 型號： | 74F545SCX |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Single 8-bit Bus Transceiver |
| 中文描述： | F/FAST SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, PDSO20 |
| 封裝： | 0.300 INCH, MS-013, SOIC-20 |
| 文件頁數(shù)： | 5/10頁 |
| 文件大?。?/td> | 84K |
| 代理商： | 74F545SCX |
Philips Semiconductors
Product specification
74F545
Octal bidirectional transceiver (with 3-State inputs/outputs)
1990 Mar 01
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
2.4
2.7
2.0
2.0
MAX
A0–A7
B0–B7
V
CC
= MIN
IL
V
= MAX,
V
= MIN
IH
I
OH
= –3mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
V
V
V
V
V
V
V
V
V
μ
A
V
OH
High-level output voltage
High-level out ut voltage
3.3
B0–B7
I
OH
= –15mA
A0–A7
V
CC
= MIN
V
IL
= MAX
V
= MIN
IH
I
OL
= 24mA
0.35
0.35
0.50
0.50
0.55
0.55
–1.2
100
V
OL
Low-level output voltage
Low-level out ut voltage
B0–B7
I
OL
= MAX
0.42
–0.73
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
Input current at
In ut current at
maximum input voltage
OE, T/R
A0–A7,
B0–B7
I
I
V
CC
= 5.5V, V
I
= 5.5V
1.0
mA
I
IH
I
IL
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
Off-state output current
Low-level voltage applied
OE, T/R
only
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
40
–40
μ
A
μ
A
I
OZH
+I
IH
V
CC
= MAX, V
I
= 2.7V
70
μ
A
I
OZL
+I
IL
V
CC
= MAX, V
I
= 0.5V
–70
μ
A
I
OS
Short-circuit output
current
3
A0–A7
B0–B7
I
CCH
I
CCL
I
CCZ
V
CC
= MAX
–60
–100
–150
–225
100
120
120
mA
μ
A
mA
mA
mA
T/R=An=4.5V, OE=GND
OE=T/R =Bn=GND
T/R=Bn=GND, OE=4.5V
84
96
96
I
CC
Supply current (total)
4
V
CC
= MAX
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
should be performed last.
4. Measure I
CC
with outputs open.
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
T
amb
= +25
°
C
V
CC
= +5.0V
C
L
= 50pF, R
L
= 500
MIN
TYP
1.5
2.5
4.5
6.0
5.5
8.0
2.5
2.0
4.5
T
amb
= 0
°
C to +70
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF, R
L
= 500
MIN
1.5
2.5
6.0
5.5
2.5
2.0
SYMBOL
PARAMETER
CONDITIONS
UNIT
MAX
5.5
6.5
10.5
9.5
7.0
6.5
MAX
6.5
7.0
11.0
10.0
8.0
7.5
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Propagation delay
An to Bn, Bn to An
Output Enable time
to High or Low level
Output Disable time
from High or Low level
Waveform 1
3.5
ns
ns
ns
ns
ns
ns
Waveform 2
Waveform 3
Waveform 2
Waveform 3
8.5
5.0
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