參數(shù)資料
型號(hào): 74FCT162823ATPACT
廠商: Texas Instruments, Inc.
元件分類: 通用總線功能
英文描述: 18-Bit Registers
中文描述: 18位寄存器
文件頁(yè)數(shù): 3/8頁(yè)
文件大?。?/td> 69K
代理商: 74FCT162823ATPACT
CY74FCT16823T
CY74FCT162823T
3
Electrical Characteristics
Over the Operating Range
Parameter
V
IH
V
IL
V
H
V
IK
I
IH
I
IL
I
OZH
Description
Test Conditions
Min.
2.0
Typ.
[5]
Max.
Unit
V
V
mV
V
μ
A
μ
A
μ
A
Input HIGH Voltage
Input LOW Voltage
Input Hysteresis
[6]
Input Clamp Diode Voltage
Input HIGH Current
Input LOW Current
HighImpedanceOutputCurrent
(Three-State Output pins)
HighImpedanceOutputCurrent
(Three-State Output pins)
Short Circuit Current
[7]
Output Drive Current
[7]
Power-Off Disable
0.8
100
0.7
V
CC
=Min., I
IN
=
18 mA
V
CC
=Max., V
I
=V
CC
V
CC
=Max., V
I
=GND
V
CC
=Max., V
OUT
=2.7V
1.2
±
1
±
1
±
1
I
OZL
V
CC
=Max., V
OUT
=0.5V
±
1
μ
A
I
OS
I
O
I
OFF
V
CC
=Max., V
OUT
=GND
V
CC
=Max., V
OUT
=2.5V
V
CC
=0V, V
OUT
4.5V
[8]
80
50
140
200
180
1
mA
mA
μ
A
Output Drive Characteristics for CY74FCT16823T
Parameter
V
OH
Description
Test Conditions
Min.
2.5
2.4
2.0
Typ.
[5]
3.5
3.5
3.0
0.2
Max.
Unit
V
Output HIGH Voltage
V
CC
=Min., I
OH
=
3 mA
V
CC
=Min., I
OH
=
15 mA
V
CC
=Min., I
OH
=
32 mA
V
CC
=Min., I
OL
=64 mA
V
OL
Output LOW Voltage
0.55
V
Output Drive Characteristics for CY74FCT162823T
Parameter
I
ODL
I
ODH
V
OH
V
OL
Description
Test Conditions
Min.
60
60
2.4
Typ.
[5]
115
115
3.3
0.3
Max.
150
150
Unit
mA
mA
V
V
Output LOW Voltage
[7]
Output HIGH Voltage
[7]
Output HIGH Voltage
Output LOW Voltage
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V
V
CC
=Min., I
OH
=
24 mA
V
CC
=Min., I
OL
=24 mA
0.55
Capacitance
[9]
(T
A
= +25C, f = 1.0 MHz)
Parameter
C
IN
C
OUT
Notes:
5.
Typical values are at V
= 5.0V, T
= +25C ambient.
6.
This input is specified but not tested.
7.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
tests should be performed last.
8.
Tested at +25C.
9.
This parameter is specified but not tested.
Description
Test Conditions
Typ.
[5]
4.5
5.5
Max.
6.0
8.0
Unit
pF
pF
Input Capacitance
Output Capacitance
V
IN
= 0V
V
OUT
= 0V
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