參數(shù)資料
型號(hào): 74LV74PWDH
廠商: NXP SEMICONDUCTORS
元件分類: 通用總線功能
英文描述: Dual D-type flip-flop with set and reset; positive-edge trigger
中文描述: LV/LV-A/LVX/H SERIES, DUAL POSITIVE EDGE TRIGGERED D FLIP-FLOP, COMPLEMENTARY OUTPUT, PDSO14
封裝: PLASTIC, TSSOP1-14
文件頁數(shù): 4/12頁
文件大小: 125K
代理商: 74LV74PWDH
Philips Semiconductors
Product specification
74LV74
Dual D-type flip-flop with set and reset;
positive edge-trigger
1998 Apr 20
4
LOGIC DIAGRAM (ONE FLIP-FLOP)
Q
Q
C
C
C
C
C
C
C
C
D
C
C
R
D
S
D
CP
SV00334
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V
CC
DC supply voltage
V
I
Input voltage
V
O
Output voltage
Operating ambient temperature range in free
air
PARAMETER
CONDITIONS
See Note1
MIN
1.0
0
0
–40
–40
TYP.
3.3
MAX
5.5
V
CC
V
CC
+85
+125
500
200
100
50
UNIT
V
V
V
T
amb
See DC and AC
characteristics
V
CC
= 1.0V to 2.0V
V
CC
= 2.0V to 2.7V
V
CC
= 2.7V to 3.6V
V
CC
= 3.6V to 5.5V
°
C
t
r
, t
f
Input rise and fall times except for
Schmitt-trigger inputs
ns/V
NOTE:
1. The LV is guaranteed to function down to V
CC
= 1.0V (input levels GND or V
CC
); DC characteristics are guaranteed from V
CC
= 1.2V to V
CC
= 5.5V.
ABSOLUTE MAXIMUM RATINGS
1, 2
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
V
CC
DC supply voltage
±
I
IK
DC input diode current
±
I
OK
DC output diode current
DC output source or sink current
– standard outputs
CONDITIONS
RATING
–0.5 to +7.0
20
50
UNIT
V
mA
mA
V
I
< –0.5 or V
I
> V
CC
+ 0.5V
V
O
< –0.5 or V
O
> V
CC
+ 0.5V
±
I
O
–0.5V < V
O
< V
CC
+ 0.5V
25
mA
±
I
GND
,
±
I
CC
T
stg
DC V
CC
or GND current for types with
–standard outputs
50
mA
Storage temperature range
Power dissipation per package
–plastic DIL
–plastic mini-pack (SO)
–plastic shrink mini-pack (SSOP and TSSOP)
–65 to +150
°
C
for temperature range: –40 to +125
°
C
above +70
°
C derate linearly with 12mW/K
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
t t
P
tot
750
500
400
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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