參數(shù)資料
型號(hào)： 7MBR10SA-140
英文描述： MCU CMOS 18LD .5K 10MHz, 0C to +70C, 18-PDIP, TUBE
中文描述： IGBT的
文件頁(yè)數(shù)： 7/15頁(yè)
文件大?。?/td> 833K
代理商： 7MBR10SA-140
H04-004-03a
15
MS6M 0802
a
11. Reliability test results
7
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Test Method 401
Method
Ⅰ
Test Method 402
method
Ⅱ
Number
of
sample
Accept-
ance
number
1 Terminal Strength Pull force
(Pull test)
2 Mounting Strength Screw torque
: 20N
: 10±1 sec.
: 2.5 ~ 3.5 N
m (M5)
: 10±1 sec.
5
( 0 : 1 )
Test time
5
( 0 : 1 )
Test time
3 Vibration
Range of frequency : 10 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Z axis
Test time
Maximum acceleration : 5000m/s
2
Pulse width
Direction
Test time
Solder temp.
Immersion time
Test time
Each terminal should be Immersed in solder
within 1~1.5mm from the body.
Solder temp.
Immersion time
Test time
Each terminal should be Immersed in solder
within 1~1.5mm from the body.
1 High Temperature Storage temp.
Storage
Test duration
2 Low Temperature Storage temp.
Storage
Test duration
3 Temperature
Storage temp.
Humidity
Relative humidity
Storage
Test duration
4 Unsaturated
Test temp.
Pressure Cooker Atmospheric pressure : 1.7 × 10
5
Pa
Test humidity
Test duration
5 Temperature
Cycle
Test temp.
Test Method 403
Reference 1
Condition code B
5
( 0 : 1 )
: 15 min.
: 100m/s
2
: 6 hr. (2hr./direction)
4 Shock
Test Method 404
Condition code B
5
( 0 : 1 )
: 1.0msec.
: Each X,Y,Z axis
: 3 times/direction
: 235±5
℃
: 5±0.5sec.
: 1 time
5 Solderabitlity
Test Method 303
Condition code A
5
( 0 : 1 )
6 Resistance to
Soldering Heat
: 260±5
℃
: 10±1sec.
: 1 time
Test Method 302
Condition code A
5
( 0 : 1 )
: 125±5
℃
: 1000hr.
: -40±5
℃
: 1000hr.
: 85±2
℃
: 85±5%
: 1000hr.
: 120
±
2
℃
Test Method 201
5
( 0 : 1 )
Test Method 202
5
( 0 : 1 )
Test Method 103
Test code C
5
( 0 : 1 )
Test Method 103
Test code E
5
( 0 : 1 )
: 85±5%
: 96hr.
Test Method 105
5
( 0 : 1 )
: Low temp. -40
±
5
℃
High temp. 125
±
5
℃
RT 5 ~ 35
℃
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
: 100 cycles
+0
: High temp. 100
-5
℃
+5
Low temp. 0
-0
℃
Dwell time
Number of cycles
6 Thermal Shock
Test Method 307
method
Ⅰ
Condition code A
5
( 0 : 1 )
Test temp.
Used liquid : Water with ice and boiling water
Dipping time
Transfer time
Number of cycles
: 5 min. par each temp.
: 10 sec.
: 10 cycles
M
E
相關(guān)PDF資料
PDF描述
7MBR10UE-120 MCU CMOS 20LD .5K 10MHz, 0C to +70C, 20-SSOP 208mil, TUBE
7MBR15KA-060 MCU CMOS 18LD .5K 10MHz, -40C to +85C, 18-SOIC 300mil, TUBE
7MBR15NE-120 MCU CMOS 20LD .5K 20MHz, 0C to +70C, 20-SSOP 208mil, TUBE
7MBR15NF-120 MCU CMOS 18LD .5K 20MHz, -40C to +85C, 18-SOIC 300mil, TUBE
7MBR15SA-120 MCU CMOS 20LD LOW PWR, 0C to +70C, 20-SSOP 208mil, TUBE
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
7MBR10SA140E-01 制造商:FUJI 制造商全稱:Fuji Electric 功能描述:IGBT Module
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7MBR10UF120 制造商:FUJI 制造商全稱:Fuji Electric 功能描述:Power Integrated Module
7MBR150VN-120-50 制造商:Fuji Electric 功能描述:IGBT 7 PK V SER 150A 1200V M720 制造商:Fuji Electric 功能描述:IGBT, 7 PK, V SER, 150A, 1200V, M720
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