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參數(shù)資料
| 型號： | 7MBR15NF-120 |
| 英文描述： | MCU CMOS 18LD .5K 20MHz, -40C to +85C, 18-SOIC 300mil, TUBE |
| 中文描述： | IGBT的7個(gè)人信息管理 |
| 文件頁數(shù)： | 7/15頁 |
| 文件大?。?/td> | 833K |
| 代理商： | 7MBR15NF-120 |
H04-004-03a
15
MS6M 0802
a
11. Reliability test results
7
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Test Method 401
Method
Ⅰ
Test Method 402
method
Ⅱ
Number
of
sample
Accept-
ance
number
1 Terminal Strength Pull force
(Pull test)
2 Mounting Strength Screw torque
: 20N
: 10±1 sec.
: 2.5 ~ 3.5 N
m (M5)
: 10±1 sec.
5
( 0 : 1 )
Test time
5
( 0 : 1 )
Test time
3 Vibration
Range of frequency : 10 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Z axis
Test time
Maximum acceleration : 5000m/s
2
Pulse width
Direction
Test time
Solder temp.
Immersion time
Test time
Each terminal should be Immersed in solder
within 1~1.5mm from the body.
Solder temp.
Immersion time
Test time
Each terminal should be Immersed in solder
within 1~1.5mm from the body.
1 High Temperature Storage temp.
Storage
Test duration
2 Low Temperature Storage temp.
Storage
Test duration
3 Temperature
Storage temp.
Humidity
Relative humidity
Storage
Test duration
4 Unsaturated
Test temp.
Pressure Cooker Atmospheric pressure : 1.7 × 10
5
Pa
Test humidity
Test duration
5 Temperature
Cycle
Test temp.
Test Method 403
Reference 1
Condition code B
5
( 0 : 1 )
: 15 min.
: 100m/s
2
: 6 hr. (2hr./direction)
4 Shock
Test Method 404
Condition code B
5
( 0 : 1 )
: 1.0msec.
: Each X,Y,Z axis
: 3 times/direction
: 235±5
℃
: 5±0.5sec.
: 1 time
5 Solderabitlity
Test Method 303
Condition code A
5
( 0 : 1 )
6 Resistance to
Soldering Heat
: 260±5
℃
: 10±1sec.
: 1 time
Test Method 302
Condition code A
5
( 0 : 1 )
: 125±5
℃
: 1000hr.
: -40±5
℃
: 1000hr.
: 85±2
℃
: 85±5%
: 1000hr.
: 120
±
2
℃
Test Method 201
5
( 0 : 1 )
Test Method 202
5
( 0 : 1 )
Test Method 103
Test code C
5
( 0 : 1 )
Test Method 103
Test code E
5
( 0 : 1 )
: 85±5%
: 96hr.
Test Method 105
5
( 0 : 1 )
: Low temp. -40
±
5
℃
High temp. 125
±
5
℃
RT 5 ~ 35
℃
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
: 100 cycles
+0
: High temp. 100
-5
℃
+5
Low temp. 0
-0
℃
Dwell time
Number of cycles
6 Thermal Shock
Test Method 307
method
Ⅰ
Condition code A
5
( 0 : 1 )
Test temp.
Used liquid : Water with ice and boiling water
Dipping time
Transfer time
Number of cycles
: 5 min. par each temp.
: 10 sec.
: 10 cycles
M
E
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| 7MBR15PE120 | 制造商:FUJI 制造商全稱:Fuji Electric 功能描述:IGBT Module(Power Integrated Module) |
| 7MBR15SA060D-01 | 制造商:FUJI 制造商全稱:Fuji Electric 功能描述:IGBT Module |
| 7MBR15SA120 | 制造商:FUJI 制造商全稱:Fuji Electric 功能描述:IGBT(1200V/15A/PIM) |
| 7MBR15SA-120 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:IGBTs |
| 7MBR15SA-120-50 | 制造商:Fuji Electric 功能描述:IGBT 7 PACK MOD 1200V 15A M711 制造商:Fuji Electric 功能描述:IGBT, 7 PACK MOD, 1200V, 15A, M711 制造商:Fuji Electric 功能描述:IGBT, 7 PACK MOD, 1200V, 15A, M711; Transistor Type:IGBT Module; DC Collector Current:15A; Collector Emitter Voltage Vces:2.1V; Power Dissipation Pd:110W; Collector Emitter Voltage V(br)ceo:1.2kV; No. of Pins:24 ;RoHS Compliant: Yes |
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